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Items where Person is "Estribeau, Magali"

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Article

Rizzolo, Serena and Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Martin-Gonthier, Philippe and Magnan, Pierre. Influence of Pixel Design on Charge Transfer Performances in CMOS Image Sensors. (2018) IEEE Transactions on Electron Devices, 65 (3). 1048-1055. ISSN 0018-9383

Goiffon, Vincent and Rizzolo, Serena and Corbière, Franck and Rolando, Sébastien and Bounasser, Said and Sergent, Marius and Chabane, Aziouz and Marcelot, Olivier and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Girard, Sylvain and Gaillardin, Marc and Marcandella, Claude and Allanche, Timothé and Van Uffelen, Marco and Casellas, Laura Mont and Scott, Robin and De Cock, Wouter. Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling. (2018) IEEE Transactions on Nuclear Science, 65 (1). 101-110. ISSN 0018-9499

Rizzolo, Serena and Goiffon, Vincent and Estribeau, Magali and Paillet, Philippe and Marcandella, Claude and Durnez, Clémentine and Magnan, Pierre. Total-Ionizing Dose Effects on Charge Transfer Efficiency and Image Lag in Pinned Photodiode CMOS Image Sensors. (2018) IEEE Transactions on Nuclear Science, 65 (1). 84-91. ISSN 0018-9499

Goiffon, Vincent and Rolando, Sébastien and Corbière, Franck and Rizzolo, Serena and Chabane, Aziouz and Girard, Sylvain and Baer, Jérémy and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin and Gaillardin, Marc and Marcandella, Claude and Marcelot, Olivier and Allanche, Timothé. Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments. (2017) IEEE Transactions on Nuclear Science, 64 (1). 45-53. ISSN 0018-9499

Lopez, Thomas and Massenot, Sébastien and Estribeau, Magali and Magnan, Pierre and Pardo, Fabrice and Pelouard, Jean-Luc. Integration of nanostructured planar diffractive lenses dedicated to near infrared detection for CMOS image sensors. (2016) Optics Express, 24 (8). 8809-8823. ISSN 1094-4087

Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Estribeau, Magali and Magnan, Pierre and Avon, Barbara and Baer, Jérémy and Gaillardin, Marc and Molina, Romain and Paillet, Philippe and Girard, Sylvain and Chabane, Aziouz and Cervantes, Paola and Marcandella, Claude. Multi-MGy Radiation Hard CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests. (2015) IEEE Transactions on Nuclear Science, 62 (6). 2956-2964. ISSN 0018-9499

Pelamatti, Alice and Belloir, Jean-Marc and Messien, Camille and Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre and Virmontois, Cédric and Saint-Pé, Olivier and Philippe, Paillet. Temperature dependence and dynamic behaviour of full well capacity in pinned photodiode CMOS image sensors. (2015) IEEE Transactions on Electron Devices, 62 (4). 1200-1207. ISSN 0018-9383

Goiffon, Vincent and Estribeau, Magali and Michelot, Julien and Cervantes, Paola and Pelamatti, Alice and Marcelot, Olivier and Magnan, Pierre. Pixel Level Characterization of Pinned Photodiode and Transfer Gate Physical Parameters in CMOS Image Sensors. (2014) IEEE Journal of the Electron Devices Society, 2 (4). 65-76. ISSN 2168-6734

Marcelot, Olivier and Estribeau, Magali and Goiffon, Vincent and Martin-Gonthier, Philippe and Corbière, Franck and Molina, Romain and Rolando, Sébastien and Magnan, Pierre. Study of CCD Transport on CMOS Imaging Technology: Comparison Between SCCD and BCCD, and Ramp Effect on the CTI. (2014) IEEE Transactions on Electron Devices, 61 (3). 844-849. ISSN 0018-9383

Goiffon, Vincent and Estribeau, Magali and Cervantes, Paola and Molina, Romain and Gaillardin, Marc and Magnan, Pierre. Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors. (2014) IEEE Transactions on Nuclear Science, 61 (6). 3290-3301. ISSN 0018-9499

Gaillardin, Marc and Goiffon, Vincent and Marcandella, Claude and Girard, Sylvain and Martinez, Martial and Paillet, Philippe and Magnan, Pierre and Estribeau, Magali. Radiation Effects in CMOS Isolation Oxides: Differences and Similarities With Thermal Oxides. (2013) IEEE Transactions on Nuclear Science, 60 (4). 2623-2629. ISSN 0018-9499

Pelamatti, Alice and Goiffon, Vincent and Estribeau, Magali and Cervantes, Paola and Magnan, Pierre. Estimation and Modeling of the Full Well Capacity in Pinned Photodiode CMOS Image Sensors. (2013) IEEE Electron Device Letters, 34 (7). 900-902. ISSN 0741-3106

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Place, Sébastien and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Estribeau, Magali and Martin-Gonthier, Philippe. Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2012) IEEE Transactions on Nuclear Science, 59 (4). 918-926. ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude. Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose. (2012) IEEE Transactions on Nuclear Science, 59 (6). 2878-2887. ISSN 0018-9499

Goiffon, Vincent and Girard, Sylvain and Magnan, Pierre and Chabane, Aziouz and Paillet, Philippe and Cervantes, Paola and Martin-Gonthier, Philippe and Baggio, Jacques and Estribeau, Magali and Bourgade, Jean-Luc and Darbon, Stéphane and Rousseau, Adrien and Glebov, Vladimir Yu and Pien, Gregory and Sangster, Thomas C.. Vulnerability of CMOS image sensors in megajoule class laser harsh environment. (2012) Optics Express, 20 (18). 20028-20042. ISSN 1094-4087

Goiffon, Vincent and Cervantes, Paola and Virmontois, Cédric and Corbière, Franck and Magnan, Pierre and Estribeau, Magali. Generic radiation hardened photodiode layouts for deep submicron CMOS image sensor processes. (2011) IEEE Transaction on Nuclear Sciences (99). ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre. Overview of ionizing radiation effects in image sensors fabricated in a deep-submicrometer CMOS imaging technology. (2009) IEEE Transactions on Electron Devices, 5 (11). 2594 -2601. ISSN 0018-9383

Conference or Workshop Item

Goiffon, Vincent and Rizzolo, Serena and Corbière, Franck and Rolando, Sébastien and Chabane, Aziouz and Sergent, Marius and Paillet, Philippe and Girard, Sylvain and Estribeau, Magali and Magnan, Pierre and Van Uffelen, Marco and Mont Casellas, Laura and Gaillardin, Marc and Scott, Robin and De Cock, Wouter. Challenges in Improving the Performances of Radiation Hard CMOS Image Sensors for Gigarad (Grad) Total Ionizing Dose. (2017) In: 2017 International Image Sensor Workshop (IISW), 30 May 2017 - 2 June 2017 (Hiroshima, Japan).

Rizzolo, Serena and Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Chabane, Aziouz and Baer, Jérémy and Estribeau, Magali and Magnan, Pierre and Marcelot, Olivier and Girard, Sylvain and Allanche, Timothé and Paillet, Philippe and Gaillardin, Marc and Marcandella, Claude and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin. Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Grad Total Ionizing Dose Environments. (2016) In: Radiation Effects on Optoelectronic Detectors (CNES Workshop), 16 September 2016 (Toulouse, France).

Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Estribeau, Magali and Avon, Barbara and Magnan, Pierre and Baer, Jérémy and Molina, Romain and Chabane, Aziouz and Cervantes, Paola and Gaillardin, Marc and Paillet, Philippe and Marcandella, Claude and Girard, Sylvain. Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests. (2015) In: Proceedings of Nuclear and Space Radiation Effects Conference (NSREC), 13 July 2015 - 17 July 2015 (Boston, United States).

Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Estribeau, Magali and Magnan, Pierre and Avon, Barbara and Baer, Jérémy and Gaillardin, Marc and Paillet, Philippe and Girard, Sylvain and Molina, Romain and Chabane, Aziouz and Cervantes, Paola and Marcandella, Claude. Toward Multi-MGy / Grad Radiation Hardened CMOS Image sensors for Nuclear Applications. (2015) In: International Image Sensor Workshop (IISW 2015), 8 June 2015 - 11 June 2015 (Vaals, Netherlands).

Girard, Sylvain and Goiffon, Vincent and Paillet, Philippe and Lépine, Thierry and Corbière, Franck and Rolando, Sébastien and Boukenter, Aziz and Alanche, Timothé and Duhamel, Olivier and Molina, Romain and Estribeau, Magali and Avon, Barbara and Baer, Jérémy and Gaillardin, Marc and Raine, Mélanie and Magnan, Pierre and Ouerdane, Youcef. Multi-MGy Radiation Hardened Camera for Nuclear Facilities. (2015) In: Proceedings of Advancements in Nuclear Instrumentation Measurement Methods and their Applications, 20 April 2015 - 24 April 2015 (Lisbon, Portugal).

Goiffon, Vincent and Estribeau, Magali and Cervantes, Paola and Molina, Romain and Gaillardin, Marc and Magnan, Pierre. Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors. (2014) In: Proceedings of Nuclear and Space Radiation Effects Conference (NSREC) 2014, 14 July 2014 - 18 July 2014 (Paris, France). (Unpublished)

Goiffon, Vincent and Michelot, Julien and Magnan, Pierre and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Pelamatti, Alice and Martin-Gonthier, Philippe. On The Pixel Level Estimation of Pinning Voltage, Pinned Photodiode Capacitance and Transfer Gate Channel Potential. (2013) In: International Image Sensor Workshop (IISW 2013), 12 June 2013 - 16 June 2013 (Snowbird Resort, Utah, United States).

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude. Radiation Effects on Pinned Photodiode CMOS Image Sensors: Overview of Pixel Performance Degradation Due to Total Ionizing Dose. (2012) In: Workshop on Radiation Effects in Optoelectronic Detectors, 28 November 2012 - 29 November 2012 (Toulouse, France). (Unpublished)

Goiffon, Vincent and Cervantes, Paola and Virmontois, Cédric and Corbière, Franck and Magnan, Pierre and Estribeau, Magali. Generic radiation hardened photodiode layouts for deep submicron CMOS image sensor processes. (2011) In: 2011 IEEE Nuclear and Space Radiation Effects Conference (NSREC), 25 July 2011 - 29 July 2011 (Las Vegas, United States).

Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Cervantes, Paola and Corbière, Franck and Estribeau, Magali. Radiation Damages in CMOS Active Pixel Sensors. (2011) In: OSA Imaging Systems and Applications, 10 July 2011 - 14 July 2011 (Toronto, Canada).

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Corbière, Franck and Estribeau, Magali and Pinel, Philippe. Radiation damages in CMOS image sensors: testing and hardening challenges brought by deep sub-micrometer CIS processes. (2010) In: SPIE Remote Sensing, 20 - 23 Sept 2010, Toulouse, France .

Djité, Ibrahima and Magnan, Pierre and Estribeau, Magali and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier. Theoretical evaluation of MTF and charge collection efficiency in CCD and CMOS image sensor. (2009) In: Proceedings of SPIE Optical engineering Applications, 2 August 2009 - 6 August 2009 (San Diego, United States).

Virmontois, Cédric and Djité, Ibrahima and Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre. Proton and g-ray irradiation on deep sub-micron processed CMOS image sensor. (2009) In: International symposium on reliability of optoelectronics for space (ISROS 2009), 11-15 May 2009, 11 May 2009 - 15 May 2009, Cagliari, Italy (Italy).

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre. Optoelectrical performance evolution of CMOS image sensors exposed to gamma radiation. (2009) In: International Image Sensor Workshop, 25-28 June 2009, Bergen, Norway .

Martin-Gonthier, Philippe and Magnan, Pierre and Corbière, Franck and Estribeau, Magali and Huger, Nicolas and Boucher, Luc. Dynamic range optimisation of CMOS image sensors dedicated to space applications. (2007) In: Remote Sensing : Sensors, Systems, and Next-Generation Satellites XI, 17 Sep 2007, Florence, Italy .

Martin-Gonthier, Philippe and Corbière, Franck and Huger, Nicolas and Estribeau, Magali and Engel, Celine and Magnan, Pierre and Saint-Pé, Olivier. Evaluation of radiation hardness design techniques to improve radiation tolerance for CMOS image sensors dedicated to space applications. (2006) In: AMICSA 2006 : The first International Workshop on Analog and Mixed-Signal Integrated Circuits for Space , 2 October 2006 - 3 October 2006 (Xanthi, Greece).

Estribeau, Magali and Magnan, Pierre. CMOS pixels crosstalk mapping and its influence on measurements accuracy for space applications. (2005) In: SPIE Remote Sensing 2005, 19 Sept 2005, Brugge, Belgium .

Saint-Pé, Olivier and Tulet, Michel and Davancens, Robert and Larnaudie, Franck and Magnan, Pierre and Martin-Gonthier, Philippe and Corbière, Franck and Estribeau, Magali. Space optical instruments optimisation thanks to CMOS image sensor technology. (2005) In: SPIE Remote Sensing 2005, 20 Sept 2005, Bruges, Belgium .

Estribeau, Magali and Magnan, Pierre. Pixel Crosstalk and Correlation with Modulation Transfer Function of CMOS Image Sensor. (2005) In: SPIE Electronic Imaging 2005, 18 Jan 2005, San Jose, United States .

Estribeau, Magali and Magnan, Pierre. CMOS pixels crosstalk mapping and Modulation Transfer Function. (2005) In: IEEE CCD&AIS Workshop 2005, 09-11 June 2005, Nagano Prefecture, Japan .

Estribeau, Magali and Magnan, Pierre. Fast MTF measurement of CMOS imagers at the chip level using ISO 12233 slanted-edge methodology. (2004) In: SPIE Remote Sensing 2004, 13 Sep 2004, Maspalomas, Gran Canarias, Spain .

Saint-Pé, Olivier and Tulet, Michel and Davancens, Robert and Larnaudie, Franck and Magnan, Pierre and Martin-Gonthier, Philippe and Corbière, Franck and Belliot, Pierre and Estribeau, Magali. Research-grade CMOS image sensors for remote sensing applications. (2004) In: SPIE Remote sensing 2004, 13 Sept 2004, Maspalomas, Gran Canarias, Spain .

Estribeau, Magali and Magnan, Pierre. Fast MTF measurement of CMOS imagers using ISO 12233 slanted-edge methodology. (2004) In: SPIE Optical System Design 2003, 30 Sept 2003, Saint-Etienne, France .

This list was generated on Sun Nov 17 00:17:35 2019 CET.