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Items where Person is "Durnez, Clémentine"

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Number of items: 14.

Article

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2019) IEEE Transactions on Nuclear Science, 66 (3). 616-624. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cédric and Goiffon, Vincent and Tauziède, Laurie and Belloir, Jean-Marc and Durnez, Clémentine and Magnan, Pierre. Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications. (2018) IEEE Transactions on Nuclear Science, 65 (8). 1645-1653. ISSN 0018-9499

Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Rizzolo, Serena and Le Roch, Alexandre and Magnan, Pierre and Paillet, Philippe and Marcandella, Claude and Rubaldo, Laurent. Total Ionizing Dose Radiation-Induced Dark Current Random Telegraph Signal in Pinned Photodiode CMOS Image Sensors. (2018) IEEE Transactions on Nuclear Science, 65 (1). 92-100. ISSN 0018-9499

Rizzolo, Serena and Goiffon, Vincent and Estribeau, Magali and Paillet, Philippe and Marcandella, Claude and Durnez, Clémentine and Magnan, Pierre. Total-Ionizing Dose Effects on Charge Transfer Efficiency and Image Lag in Pinned Photodiode CMOS Image Sensors. (2018) IEEE Transactions on Nuclear Science, 65 (1). 84-91. ISSN 0018-9499

Belloir, Jean-Marc and Lincelles, Jean-Baptiste and Pelamatti, Alice and Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Paillet, Philippe and Magnan, Pierre and Gilard, Olivier. Dark Current Blooming in Pinned Photodiode CMOS Image Sensors. (2017) IEEE Transactions on Electron Devices, 64 (3). 11161-1166. ISSN 0018-9383

Belloir, Jean-Marc and Goiffon, Vincent and Raine, Mélanie and Virmontois, Cédric and Durnez, Clémentine and Paillet, Philippe and Magnan, Pierre and Gilard, Olivier and Molina, Romain. Dark Current Spectroscopy in neutron, proton and ion irradiated CMOS Image Sensors: from Point Defects to Clusters. (2017) IEEE Transactions on Nuclear Science, 64 (1). 27-37. ISSN 0018-9499

Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Belloir, Jean-Marc and Magnan, Pierre and Rubaldo, Laurent. In-Depth Analysis on Radiation Induced Multi-Level Dark Current Random Telegraph Signal in Silicon Solid State Image Sensors. (2017) IEEE Transactions on Nuclear Science, 64 (1). 19-26. ISSN 0018-9499

Virmontois, Cédric and Toulemont, Arthur and Rolland, Guy and Materne, Alex and Lalucaa, Valerian and Goiffon, Vincent and Codreanu, Catalin and Durnez, Clémentine and Bardoux, Alain. Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors. (2014) IEEE Transactions on Nuclear Science, 61 (6). 3331-3340. ISSN 0018-9499

Conference or Workshop Item

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions. (2018) In: CNES Workshop: Radiation Effects on Optoelectronic Detectors, 27 November 2018 (Toulouse, France). (Unpublished)

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2018) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

Durnez, Clémentine and Goiffon, Vincent and Rizzolo, Serena and Magnan, Pierre and Virmontois, Cédric and Rubaldo, Laurent. Localization of Dark Current Random Telegraph Signal sources in pinned photodiode CMOS Image Sensors. (2017) In: 2017 International Conference on Noise and Fluctuations (ICNF), 20 June 2017 - 23 June 2017 (Vilnius, Lithuania).

Le Roch, Alexandre and Goiffon, Vincent and Durnez, Clémentine and Magnan, Pierre and Virmontois, Cédric and Pistre, L. and Belloir, Jean-Marc. Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application. (2017) In: RADECS 2017 : Radiation and Its Effects on Components and Systems, 2 October 2017 - 6 October 2017 (Geneva, Switzerland). (Unpublished)

Le Roch, Alexandre and Goiffon, Vincent and Durnez, Clémentine and Magnan, Pierre and Virmontois, Cédric and Pistre, L. and Belloir, Jean-Marc. Radiation-Induced Defects in a Commercial Image Sensor for Space Applications. (2017) In: CNES Workshop: CMOS Image Sensors for High Performance Applications, 21 November 2017 - 22 November 2017 (Toulouse, France). (Unpublished)

Thesis

Durnez, Clémentine. Analyse des fluctuations discrètes du courant d’obscurité dans les imageurs à semi-conducteurs à base de silicium et Antimoniure d’Indium. PhD, Micro et nanosystèmes, Institut Supérieur de l’Aéronautique et de l’Espace, 2017, 199 p.

This list was generated on Mon Jul 22 05:14:45 2019 CEST.