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Items where Person is "Durier, André"

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Number of items: 13.

Article

Zerarka, Moustafa and Austin, Patrick and Bensoussan, Alain and Morancho, Frédéric and Durier, André. TCAD simulation of the single event effects in normally-off GaN transistors after heavy ion radiation. (2017) IEEE Transactions on Nuclear Science, 64 (8). 2242-2249. ISSN 0018-9499

Durier, André and Bensoussan, Alain and Zerarka, Moustafa and Ghfiri, Chaimae and Boyer, Alexandre and Frémont, Hélène. A methodologic project to characterize and model COTS component reliability. (2015) Microelectronics Reliability, 55 (9). 2097-2102. ISSN 0026-2714

Conference or Workshop Item

Ghfiri, Chaimae and Durier, André and Boyer, Alexandre and Ben Dhia, Sonia. A new methodology to extract the ICEM-CE internal activity block of a FPGA. (2017) In: EMC Europe, 4 September 2017 - 8 September 2017 (Angers, France).

Hairoud Airieau, Siham and Dubois, Tristan and Duchamp, Geneviève and Durier, André. An Analog-to-Digital Converter Immunity Modelling based on a Stochastic Approach. (2017) In: EMC Europe 2017, 4 September 2017 - 8 September 2017 (Angers, France).

Ghfiri, Chaimae and Durier, André and Boyer, Alexandre and Ben Dhia, Sonia. Methodology of modeling of the internal activity of a FPGA for conducted emission prediction purpose. (2017) In: EMCCompo 2017, 4 July 2017 - 8 July 2017 (Saint Petersburg, Russian Federation).

Boyer, Alexandre and Gonzalez Sentis, Manuel Antero and Ghfiri, Chaimae and Durier, André. Modeling methodology of the conducted emission of a DC-DC converter board. (2017) In: EMC Compo 2017 (The 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits), 4 July 2017 - 8 July 2017 (Saint Petersburg, Russian Federation).

Boyer, Alexandre and Gonzalez Sentis, Manuel Antero and Ghfiri, Chaimae and Durier, André. Study of the thermal aging effect on the conducted emission of a synchronous buck converter. (2017) In: EMC Compo (The 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits), 4 July 2017 - 8 July 2017 (St. Petersburg, Russian Federation).

Zerarka, Moustafa and Austin, Patrick and Bensoussan, Alain and Morancho, Frédéric and Durier, André. TCAD simulation of the Single Event Effects in normally-off GaN transistors after heavy ion radiation. (2017) In: 16th European Conference on Radiation and Its Effects on Components and Systems 2016 (RADECS), 19 September 2016 - 23 September 2016 (Bremen, Germany).

Hairoud Airieau, Siham and Dubois, Tristan and Duchamp, Geneviève and Durier, André. Multiport ICIM-CI modeling approach applied to a bandgap voltage reference. (2016) In: EMC Europe 2016, 5 September 2016 - 9 September 2016 (Wroclaw, Poland).

Ghfiri, Chaimae and Durier, André and Boyer, Alexandre and Ben Dhia, Sonia and Marot, Christian. Construction of an Integrated Circuit Emission Model of a FPGA. (2016) In: 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 17 May 2016 - 21 May 2016 (Shenzhen, China).

Durier, André and Boyer, Alexandre and Duchamp, Geneviève. A methodologic project to characterize and model COTS components EMC behavior after ageing. (2016) In: 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 17 May 2016 - 21 May 2016 (Shenzhen, China).

Ghfiri, Chaimae and Boyer, Alexandre and Durier, André and Ben Dhia, Sonia and Marot, Christian. Construction d'un modèle ICEM pour prédire l'émission électromagnétique d'un FPGA. (2016) In: 18ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique (CEM2016), 11 July 2016 - 13 July 2016 (Rennes, France).

Hairoud Airieau, Siham and Dubois, Tristan and Duchamp, Geneviève and Durier, André. Modèle ICIM-CI multiports d'une référence de tension. (2016) In: CEM 2016 (18ème Colloque International et Exposition sur la Compatibilité ÉlectroMagnétique), 11 July 2016 - 13 July 2016 (Rennes, France).

This list was generated on Thu Dec 5 18:52:28 2019 CET.