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Items where Person is "Desjonquères, Hortense"

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Number of items: 4.

Article

Rizzolo, Serena and Goiffon, Vincent and Corbière, Franck and Molina, Romain and Chabane, Aziouz and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Boukenter, Aziz and Allanche, Timothé and Muller, Cyprien and Monsanglant-Louvet, Celine and Osmond, Melanie and Desjonquères, Hortense and Macé, Jean Reynald and Burnichon, Pierre and Baudu, Jean-Pierre and Plumeri, Stéphane. Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels. (2019) IEEE Transactions on Nuclear Science, 66 (1). 111-119. ISSN 0018-9499

Conference or Workshop Item

Dewitte, Hugo and Rizzolo, Serena and Paillet, Philippe and Magnan, Pierre and Le Roch, Alexandre and Corbière, Franck and Molina, Romain and Girard, Sylvain and Allanche, Timothé and Muller, Cyprien and Desjonquères, Hortense and Macé, Jean Reynald and Baudu, Jean-Pierre and Saravia Flores, A. and Goiffon, Vincent. Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses. (2019) In: Radiation and its Effects on Components and Systems - RADECS 2019, 16 September 2019 - 20 September 2019 (Montpellier, France).

Goiffon, Vincent and Allanche, Timothé and Muller, Cyprien and Girard, Sylvain and Paillet, Philippe and Macé, Jean Reynald and Osmond, Melanie and Burnichon, Pierre and Plumeri, Stéphane and Baudu, Jean-Pierre and Boukenter, Aziz and Magnan, Pierre and Rizzolo, Serena and Corbière, Franck and Duhamel, Olivier and Rousson, johanna and Desjonquères, Hortense and Molina, Romain and Ouerdane, Youcef and Lépine, Thierry. CAMRAD: Development of a Multi-Megagray Radiation Hard CMOS Camera for Dismantling Operations. (2018) In: Dismantling Challenges: Industrial Reality, Prospects and Feedback Experience (DEM 2018), 22 October 2018 - 24 October 2018 (Avignon, France).

Rizzolo, Serena and Goiffon, Vincent and Corbière, Franck and Molina, Romain and Chabane, Aziouz and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Boukenter, Aziz and Allanche, Timothé and Muller, Cyprien and Monsanglant-Louvet, Celine and Osmond, Melanie and Desjonquères, Hortense and Macé, Jean Reynald and Burnichon, Pierre and Baudu, Jean-Pierre and Plumeri, Stéphane. Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels. (2018) In: Radiation Effects on Optoelectronic Detectors (CNES Workshop), 27 November 2018 (Toulouse, France). (Unpublished)

This list was generated on Thu Aug 6 12:42:23 2020 CEST.