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Items where Person is "Bensoussan, Alain"

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Number of items: 13.

Article

Rousselin, Thomas and Hubert, Guillaume and Régis, Didier and Gatti, Marc and Bensoussan, Alain. Impact of aging on the soft error rate of 6T SRAM for planar and bulk technologies. (2017) Microelectronics Reliability, 76-77. 159-163. ISSN 0026-2714

Zerarka, Moustafa and Austin, Patrick and Bensoussan, Alain and Morancho, Frédéric and Durier, André. TCAD simulation of the single event effects in normally-off GaN transistors after heavy ion radiation. (2017) IEEE Transactions on Nuclear Science, 64 (8). 2242-2249. ISSN 0018-9499

Bensoussan, Alain. Microelectronic reliability models for more than moore nanotechnology products. (2017) Facta Universitatis, Series: Electronics and Energetics, 30 (1). 1 - 26. ISSN 0353-3670

Bernstein, Joseph B and Bensoussan, Alain and Bender, Emmanuel. Reliability Prediction with MTOL. (2017) Microelectronics Reliability, 68. 91 - 97. ISSN 0026-2714

Bensoussan, Alain. How to quantify and predict long term multiple stress operation: Application to Normally-Off Power GaN transistor technologies. (2016) Microelectronics Reliability, 58. 103-112. ISSN 0026-2714

Durier, André and Bensoussan, Alain and Zerarka, Moustafa and Ghfiri, Chaimae and Boyer, Alexandre and Frémont, Hélène. A methodologic project to characterize and model COTS component reliability. (2015) Microelectronics Reliability, 55 (9). 2097-2102. ISSN 0026-2714

Bensoussan, Alain and Suhir, Ephraim and Henderson, Philip and Zahir, Mustapha. A unified multiple stress reliability model for microelectronic devices — Application to 1.55 μm DFB laser diode module for space validation. (2015) Microelectronics Reliability, 55. 1729-1735. ISSN 0026-2714

Conference or Workshop Item

Zerarka, Moustafa and Austin, Patrick and Bensoussan, Alain and Morancho, Frédéric and Durier, André. TCAD simulation of the Single Event Effects in normally-off GaN transistors after heavy ion radiation. (2017) In: 16th European Conference on Radiation and Its Effects on Components and Systems 2016 (RADECS), 19 September 2016 - 23 September 2016 (Bremen, Germany).

Bensoussan, Alain. M-STORM Reliability model applied to DSM Technologies. (2016) In: NMDC 2016 (Nanotechnology Materials and Devices Conference), 9 October 2016 - 12 October 2016 (Toulouse, France).

Suhir, Ephraim and Bensoussan, Alain and Nicolics, Johann. Bow-Free Tri-Component mechanically pre-stressed failure-oriented-accelerated-test (FOAT) specimen. (2015) In: SAE 2015 (SAE AeroTech Congress & Exhibition), 22 September 2015 - 24 September 2015 (Seattle, United States).

Suhir, Ephraim and Bensoussan, Alain and Nicolics, Johann. Predicted device-degradation failure-rate. (2015) In: SAE 2015 (SAE AeroTech Congress & Exhibition), 22 September 2015 - 24 September 2015 (Seattle, United States).

Suhir, Ephraim and Bensoussan, Alain and Khatibi, Golta and Nicolics, Johann. Probabilistic design for reliability in electronics and photonics : Role, significance, attributes, challenges. (2015) In: IRPS 2015 (IEEE International Reliability Physics Symposium), 19 April 2015 - 23 April 2015 (Monterey (CA), United States).

Suhir, Ephraim and Bensoussan, Alain. Quantified reliability of aerospace optoelectronics. (2014) In: SAE 2014 (Aerospace Conference), 23 September 2014 - 25 September 2014 (Cincinnati, United States).

This list was generated on Sun Aug 9 00:10:15 2020 CEST.