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Items where Person is "Belloir, Jean-Marc"

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Article

Goiffon, Vincent and Bilba, Teddy and Deladerriere, Theo and Beaugendre, Guillaume and Le Roch, Alexandre and Dion, Arnaud and Virmontois, Cedric and Belloir, Jean-Marc and Gaillardin, Marc and Jay, Antoine and Paillet, Philippe. Radiation Induced Variable Retention Time in Dynamic Random Access Memories. (2020) IEEE Transactions on Nuclear Science, 67 (1). 1-13. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2019) IEEE Transactions on Nuclear Science, 66 (3). 616-624. ISSN 0018-9499

Le Roch, Alexandre and Virmontois, Cédric and Goiffon, Vincent and Tauziède, Laurie and Belloir, Jean-Marc and Durnez, Clémentine and Magnan, Pierre. Radiation-Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Applications. (2018) IEEE Transactions on Nuclear Science, 65 (8). 1645-1653. ISSN 0018-9499

Belloir, Jean-Marc and Lincelles, Jean-Baptiste and Pelamatti, Alice and Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Paillet, Philippe and Magnan, Pierre and Gilard, Olivier. Dark Current Blooming in Pinned Photodiode CMOS Image Sensors. (2017) IEEE Transactions on Electron Devices, 64 (3). 11161-1166. ISSN 0018-9383

Belloir, Jean-Marc and Goiffon, Vincent and Raine, Mélanie and Virmontois, Cédric and Durnez, Clémentine and Paillet, Philippe and Magnan, Pierre and Gilard, Olivier and Molina, Romain. Dark Current Spectroscopy in neutron, proton and ion irradiated CMOS Image Sensors: from Point Defects to Clusters. (2017) IEEE Transactions on Nuclear Science, 64 (1). 27-37. ISSN 0018-9499

Durnez, Clémentine and Goiffon, Vincent and Virmontois, Cédric and Belloir, Jean-Marc and Magnan, Pierre and Rubaldo, Laurent. In-Depth Analysis on Radiation Induced Multi-Level Dark Current Random Telegraph Signal in Silicon Solid State Image Sensors. (2017) IEEE Transactions on Nuclear Science, 64 (1). 19-26. ISSN 0018-9499

Belloir, Jean-Marc and Goiffon, Vincent and Virmontois, Cédric and Paillet, Philippe and Raine, Mélanie and Magnan, Pierre and Gilard, Olivier. Dark Current Spectroscopy on Alpha Irradiated Pinned Photodiode CMOS Image Sensors. (2016) IEEE Transactions on Nuclear Science, 63 (4). 2183-2192. ISSN 0018-9499

Belloir, Jean-Marc and Goiffon, Vincent and Virmontois, Cédric and Raine, Mélanie and Paillet, Philippe and Duhamel, Olivier and Gaillardin, Marc and Magnan, Pierre and Gilard, Olivier. Pixel pitch and particle energy influence on the dark current distribution of neutron irradiated CMOS image sensors. (2016) Optics Express, 24 (4). 4299-4315. ISSN 1094-4087

Pelamatti, Alice and Belloir, Jean-Marc and Messien, Camille and Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre and Virmontois, Cédric and Saint-Pé, Olivier and Philippe, Paillet. Temperature dependence and dynamic behaviour of full well capacity in pinned photodiode CMOS image sensors. (2015) IEEE Transactions on Electron Devices, 62 (4). 1200-1207. ISSN 0018-9383

Raine, Mélanie and Goiffon, Vincent and Paillet, Philippe and Duhamel, Olivier and Girard, Sylvain and Gaillardin, Marc and Virmontois, Cédric and Belloir, Jean-Marc and Richard, Nicolas and Magnan, Pierre. Exploring the Kinetics of Formation and Annealing of Single Particle Displacement Damage in Microvolumes of Silicon. (2014) IEEE Transactions on Nuclear Science, 61 (6). 2826-2833. ISSN 0018-9499

Conference or Workshop Item

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions. (2019) In: 2018 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2018) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

Le Roch, Alexandre and Goiffon, Vincent and Durnez, Clémentine and Magnan, Pierre and Virmontois, Cédric and Pistre, L. and Belloir, Jean-Marc. Radiation Induced Defects in 8T-CMOS Global Shutter Image Sensor for Space Application. (2017) In: RADECS 2017 : Radiation and Its Effects on Components and Systems, 2 October 2017 - 6 October 2017 (Geneva, Switzerland). (Unpublished)

Le Roch, Alexandre and Goiffon, Vincent and Durnez, Clémentine and Magnan, Pierre and Virmontois, Cédric and Pistre, L. and Belloir, Jean-Marc. Radiation-Induced Defects in a Commercial Image Sensor for Space Applications. (2017) In: CNES Workshop: CMOS Image Sensors for High Performance Applications, 21 November 2017 - 22 November 2017 (Toulouse, France). (Unpublished)

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe. Dark Current Spectroscopy in neutron, proton and ion irradiated CMOS Image Sensors. (2016) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2016), 11 July 2016 - 15 July 2016 (Portland, United States).

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe. Dark Current Spectroscopy on Alpha Irradiated Pinned Photodiode CMOS Image Sensors. (2015) In: 15th European Conference RADECS 2015, 14 September 2015 - 18 September 2015 (Moscou, Russian Federation).

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe and Duhamel, Olivier and Gaillardin, Marc. Pixel Pitch and Particle Energy Influence on the Dark Current Distribution of Neutron Irradiated CMOS Image Sensors. (2015) In: IEEE Nuclear & Space Radiation Effects Conference (NSREC 2015), 13 July 2015 - 17 July 2015 (Boston, United States).

Belloir, Jean-Marc and Goiffon, Vincent and Pelamatti, Alice and Lincelles, Jean-Baptiste and Virmontois, Cédric and Magnan, Pierre and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe. Dark Current Blooming in Pinned Photodiode CMOS Image Sensors. (2015) In: CMOS Image sensors for high performance applications, 18 November 2015 - 19 November 2015 (Toulouse, France). (Unpublished)

Raine, Mélanie and Goiffon, Vincent and Paillet, Philippe and Duhamel, Olivier and Girard, Sylvain and Gaillardin, Marc and Virmontois, Cédric and Belloir, Jean-Marc and Richard, Nicolas and Magnan, Pierre. Exploring the Kinetics of Formation and Annealing of Single Particle Displacement Damage in Microvolumes of Silicon. (2014) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC), 14 July 2014 - 18 July 2014 (Paris, France).

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe. Validation of a model for Dark Current Non Uniformity generated by Displacement Damage Dose in irradiated CMOS Image Sensors. (2014) In: Workshop CNES : Radiation Effects on Optoelectronic Devices, 27 November 2014 (Toulouse, France). (Unpublished)

This list was generated on Fri Aug 7 18:03:17 2020 CEST.