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Items where Person is "Austin, Patrick"
Group by: Item Type | No Grouping Jump to: Article | Conference or Workshop Item Number of items: 2. ArticleZerarka, Moustafa and Austin, Patrick and Bensoussan, Alain and Morancho, Frédéric and Durier, André. TCAD simulation of the single event effects in normally-off GaN transistors after heavy ion radiation. (2017) IEEE Transactions on Nuclear Science, 64 (8). 2242-2249. ISSN 0018-9499 Conference or Workshop ItemZerarka, Moustafa and Austin, Patrick and Bensoussan, Alain and Morancho, Frédéric and Durier, André. TCAD simulation of the Single Event Effects in normally-off GaN transistors after heavy ion radiation. (2017) In: 16th European Conference on Radiation and Its Effects on Components and Systems 2016 (RADECS), 19 September 2016 - 23 September 2016 (Bremen, Germany). |
