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Items where Person is "Allanche, Timothé"

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Number of items: 7.

Article

Rizzolo, Serena and Goiffon, Vincent and Corbière, Franck and Molina, Romain and Chabane, Aziouz and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Boukenter, Aziz and Allanche, Timothé and Muller, Cyprien and Monsanglant-Louvet, Celine and Osmond, Melanie and Desjonquères, Hortense and Macé, Jean Reynald and Burnichon, Pierre and Baudu, Jean-Pierre and Plumeri, Stéphane. Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels. (2019) IEEE Transactions on Nuclear Science, 66 (1). 111-119. ISSN 0018-9499

Sabatier, Camille and Rizzolo, Serena and Morana, Adriana and Allanche, Timothé and Robin, Thierry and Cadier, Benoît and Paillet, Philippe and Gaillardin, Marc and Duhamel, Olivier and Marcandella, Claude and Aubert, Damien and Assaillit, Gilles and Auriel, Gérard and Boukenter, Aziz and Ouerdane, Youcef and Mescia, Luciano and Marin, Emmanuel and Girard, Sylvain. 6-MeV Electron Exposure Effects on OFDR-Based Distributed Fiber-Based Sensors. (2018) IEEE Transactions on Nuclear Science, 65 (8). 1598-1603. ISSN 0018-9499

Goiffon, Vincent and Rizzolo, Serena and Corbière, Franck and Rolando, Sébastien and Bounasser, Said and Sergent, Marius and Chabane, Aziouz and Marcelot, Olivier and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Girard, Sylvain and Gaillardin, Marc and Marcandella, Claude and Allanche, Timothé and Van Uffelen, Marco and Casellas, Laura Mont and Scott, Robin and De Cock, Wouter. Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling. (2018) IEEE Transactions on Nuclear Science, 65 (1). 101-110. ISSN 0018-9499

Allanche, Timothé and Paillet, Philippe and Goiffon, Vincent and Muller, Cyprien and Van Uffelen, Marco and Mont-Casellas, Laura and Duhamel, Olivier and Marcandella, Claude and Rizzolo, Serena and Magnan, Pierre and Clerc, Raphael and Lépine, Thierry and Hébert, Mathieu and Boukenter, Aziz and Ouerdane, Youcef and Scott, Robin and De Cock, Wouter and Girard, Sylvain. Vulnerability and Hardening Studies of Optical and Illumination Systems at MGy Dose Levels. (2018) IEEE Transactions on Nuclear Science, 65 (1). 132-140. ISSN 0018-9499

Goiffon, Vincent and Rolando, Sébastien and Corbière, Franck and Rizzolo, Serena and Chabane, Aziouz and Girard, Sylvain and Baer, Jérémy and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin and Gaillardin, Marc and Marcandella, Claude and Marcelot, Olivier and Allanche, Timothé. Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments. (2017) IEEE Transactions on Nuclear Science, 64 (1). 45-53. ISSN 0018-9499

Rizzolo, Serena and Boukenter, Aziz and Allanche, Timothé and Périsse, Jocelyn and Bouwmans, Géraud and El Hamzaoui, Hicham and Bigot, Laurent and Ouerdane, Youcef and Cannas, Marco and Bouazaoui, Mohammed and Macé, Jean-Reynald and Bauer, Sophie and Girard, Sylvain. Optical Frequency Domain Reflectometer Distributed Sensing Using Microstructured Pure Silica Optical Fibers Under Radiations. (2016) IEEE Transactions on Nuclear Science, 63 (4). 2038-2045. ISSN 0018-9499

Conference or Workshop Item

Allanche, Timothé and Goiffon, Vincent and Rizzolo, Serena and Paillet, Philippe and Chabane, Aziouz and Duhamel, Olivier and Muller, Cyprien and Magnan, Pierre and Clerc, Raphael and Marin, Emmanuel and Boukenter, Aziz and Ouerdane, Youcef and Girard, Sylvain. Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor. (2017) In: Radiation and Its Effects on Components and Systems (RADECS 2017), 2 October 2017 - 6 October 2017 (Genève, Switzerland).

This list was generated on Wed Mar 20 12:50:31 2019 CET.