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Items where Person is "Alegría, Angel"
Group by: Item Type | No Grouping Jump to: Article | Book Section Number of items: 7. ArticleSchwartz, Gustavo Ariel and Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Alegría, Angel and Colmenero, Juan. Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM). (2011) Ultramicroscopy, 111 (8). 1366-1369. ISSN 0304-3991 Riedel, Clément and Sweeney, Ryan and Israeloff, Nathan E. and Arinero, Richard and Schwartz, Gustavo Ariel and Alegría, Angel and Tordjeman, Philippe and Colmenero, Juan. Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy. (2010) Applied Physics Letters, 96 (21). ISSN 0003-6951 Riedel, Clément and Alegría, Angel and Tordjeman, Philippe and Colmenero, Juan. High and low molecular weight crossovers in the longest relaxation time dependence of linear cis-1,4 polyisoprene by dielectric relaxations. (2010) Rheologica Acta, 49 (5). 507-512. ISSN 0035-4511 Riedel, Clément and Schwartz, Gustavo Ariel and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Alegría, Angel and Colmenero, Juan. Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images. (2010) Ultramicroscopy, 110 (6). 634-638. ISSN 0304-3991 Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Ramonda, Michel and Lévêque, Gérard and Schwartz, Gustavo Ariel and De Oteyza, Dimas G. and Alegría, Angel and Colmenero, Juan. Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. (2010) The European Physical Journal Applied Physics, 50 (1). 10501 1-10501 8. ISSN 1286-0042 Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Schwartz, Gustavo Ariel and Alegría, Angel and Colmenero, Juan. Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy. (2010) Physical Review E, 81 (1). ISSN 1539-3755 Book SectionArinero, Richard and Riedel, Clément and Schwartz, Gustavo Ariel and Lévêque, Gérard and Alegría, Angel and Tordjeman, Philippe and Israeloff, Nathan E. and Ramonda, Michel and Colmenero, Juan. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; 4). Formatex Research Center, Spain, 1963-1977. ISBN 978-84-614-6191-2 |
