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Marcelot, Olivier and Goiffon, Vincent and Nallet, Franck and Magnan, Pierre Pinned Photodiode CMOS Image Sensor\\TCAD Simulation: in-Depth Analysis of in-Pixel Pinning Voltage Measurement for a Diagnostic Tool. (2017) IEEE Transactions on Electron Devices, 64 (2). 455-462. ISSN 0018-9383

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