Number of items at this level: 3.
Goiffon, Vincent
and Rizzolo, Serena and Corbière, Franck and Rolando, Sébastien and Bounasser, Said and Sergent, Marius and Chabane, Aziouz and Marcelot, Olivier and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Girard, Sylvain and Gaillardin, Marc and Marcandella, Claude and Allanche, Timothé and Van Uffelen, Marco and Casellas, Laura Mont and Scott, Robin and De Cock, Wouter
Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling.
(2018)
IEEE Transactions on Nuclear Science, 65 (1). 101-110. ISSN 0018-9499
Goiffon, Vincent and Rolando, Sébastien and Corbière, Franck and Rizzolo, Serena and Chabane, Aziouz and Girard, Sylvain and Baer, Jérémy and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin and Gaillardin, Marc and Marcandella, Claude and Marcelot, Olivier and Allanche, Timothé
Radiation Hardening of Digital Color CMOS Camera-on-a-Chip Building Blocks for Multi-MGy Total Ionizing Dose Environments.
(2017)
IEEE Transactions on Nuclear Science, 64 (1). 45-53. ISSN 0018-9499
Rizzolo, Serena and Goiffon, Vincent and Sergent, Marius and Corbière, Franck and Rolando, Sébastien and Chabane, Aziouz and Paillet, Philippe and Marcandella, Claude and Girard, Sylvain and Magnan, Pierre and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin and De Cock, Wouter
Multi-MGy total ionizing dose induced MOSFET variability effects on radiation hardened CMOS image sensor performances.
(2017)
In: Radiations Effects on Components and Systems (RADECS), 2 October 2017 - 6 October 2017 (Geneva, Switzerland).
This list was generated on Fri May 20 23:26:17 2022 CEST.
