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Le Roch, Alexandre and Virmontois, Cedric and Paillet, Philippe and Warner, Jeffrey H. and Belloir, Jean-Marc and Magnan, Pierre and Goiffon, Vincent Comparison of X-Ray and Electron Radiation Effects on Dark Current Non-Uniformity and Fluctuations in CMOS Image Sensors. (2020) IEEE Transactions on Nuclear Science, 67 (1). 268-277. ISSN 0018-9499

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