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Items where Institution is :Other partners > Gooch & Housego (UNITED KINGDOM)

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Bensoussan, Alain and Suhir, Ephraim and Henderson, Philip and Zahir, Mustapha A unified multiple stress reliability model for microelectronic devices — Application to 1.55 μm DFB laser diode module for space validation. (2015) Microelectronics Reliability, 55. 1729-1735. ISSN 0026-2714

This list was generated on Tue Oct 23 09:20:56 2018 CEST.