Items where Institution is :Other partners > Centre d'Etude de l'Energie Nucléaire - SCK-CEN (BELGIQUE)

Rizzolo, Serena and Goiffon, Vincent and Sergent, Marius and Corbière, Franck and Rolando, Sébastien and Chabane, Aziouz and Paillet, Philippe and Marcandella, Claude and Girard, Sylvain and Magnan, Pierre and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin and De Cock, Wouter Multi-MGy total ionizing dose induced MOSFET variability effects on radiation hardened CMOS image sensor performances. (2017) In: Radiations Effects on Components and Systems (RADECS), 2 October 2017 - 6 October 2017 (Geneva, Switzerland).