Number of items at this level: 1.
Rizzolo, Serena
and Goiffon, Vincent
and Sergent, Marius
and Corbière, Franck
and Rolando, Sébastien
and Chabane, Aziouz
and Paillet, Philippe and Marcandella, Claude and Girard, Sylvain and Magnan, Pierre
and Van Uffelen, Marco and Mont Casellas, Laura and Scott, Robin and De Cock, Wouter
Multi-MGy total ionizing dose induced MOSFET variability effects on radiation hardened CMOS image sensor performances.
(2017)
In: Radiations Effects on Components and Systems (RADECS), 2 October 2017 - 6 October 2017 (Geneva, Switzerland).
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