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Real-cases of electromagnetic immunity and reliability in embedded electronics architectures

Diénot, Jean-Marc and Batista, Emmanuel Real-cases of electromagnetic immunity and reliability in embedded electronics architectures. (2012) In: EUROEM 2012, 2 July 2012 - 6 July 2012 (Toulouse, France).

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Official URL: http://www.euroem.org/

Abstract

This papers concerns works about electromagnetic immunity and reliability investigations on electronics devices, combined with different physical impacts as temperature.

Item Type:Conference or Workshop Item (Paper)
HAL Id:hal-01977489
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:Université de Toulouse > Université Toulouse III - Paul Sabatier - UPS (FRANCE)
Other partners > ALSTOM Transport (FRANCE)
Laboratory name:
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Deposited By: Jean-Marc Dienot
Deposited On:23 Apr 2013 14:12

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