Diénot, Jean-Marc
and Batista, Emmanuel
Real-cases of electromagnetic immunity and reliability in embedded electronics architectures.
(2012)
In: EUROEM 2012, 2 July 2012 - 6 July 2012 (Toulouse, France).
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(Document in English)
PDF ( Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader 306kB |
Official URL: http://www.euroem.org/
Abstract
This papers concerns works about electromagnetic immunity and reliability investigations on electronics devices, combined with different physical impacts as temperature.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| HAL Id: | hal-01977489 |
| Audience (conference): | International conference proceedings |
| Uncontrolled Keywords: | |
| Institution: | Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE) Other partners > ALSTOM Transport (FRANCE) |
| Laboratory name: | Laboratoire Génie de Production - LGP (Tarbes, France) - DIDS - LABCEEM |
| Statistics: | download |
| Deposited On: | 23 Apr 2013 14:12 |
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