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Mitigation technique for use of CMOS image sensors in megajoule class laser radiative environment

Goiffon, Vincent and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Chabane, Aziouz and Rousseau, Adrien and Darbon, Stéphane and Cervantes, Paola and Bourgade, Jean-Luc Mitigation technique for use of CMOS image sensors in megajoule class laser radiative environment. (2012) IEEE Electronics Letters , 48 (21). 1338-1339. ISSN 0013-5194

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Official URL: http://dx.doi.org/10.1049/el.2012.2667


Presented is a new mitigation technique to improve the radiation tolerance of CMOS image sensors to the radiation constraints associated to the fusion by inertial confinement experiments at megajoule class laser facilities. Using the global reset mode, results acquired at the OMEGA facility show the efficiency of this technique to reduce by more than 70% the number of white pixels induced by the mixed 14%MeV neutron and %-ray pulse.

Item Type:Article
Additional Information:Thanks to IEEE editor. (c) 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. The definitive version is available at http://ieeexplore.ieee.org
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:French research institutions > Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Other partners > Université Jean Monnet - St Etienne (FRANCE)
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Deposited On:06 Dec 2012 13:26

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