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Impact of the surface roughness on the electrical capacitance

Albina, Audrey and Taberna, Pierre-Louis and Cambronne, Jean-Pascal and Simon, Patrice and Flahaut, Emmanuel and Lebey, Thierry Impact of the surface roughness on the electrical capacitance. (2006) Microelectronics Journal, 3 (8). 752-758. ISSN 0026-2692

(Document in English)

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Official URL: http://dx.doi.org/10.1016/j.mejo.2005.10.008


A new hybrid approach consists to use the advantages of both systems namely the high geometric aspects of the electrodes of the ultracapacitor and the high dielectric strength of polymer materials used in dielectric capacitors. The surface roughness of the electrodes of the ultracapacitor is manufactured with nano-porous materials; activated carbon and carbon nanotubes (CNTs). Many compositions of both carbonaceous materials are tested with different insulating materials (liquid and solid) to constitute the hybrid capacitor. It appears that the capacitance increases with the carbonaceous composition: An increasing from 15 to 40% is observed as compared to a plane capacitor, it can be twice with a 100 wt% of CNTs content. But, the impregnation of the insulating material in the surface roughness remains the key point of the realization of the hybrid capacitor. The roughness accessibility is a major property to optimize in order to improve the impregnation of the insulating material to increase the electrical capacitance.

Item Type:Article
Additional Information:Thanks to Elsevier editor. The definitive version is available at http://www.sciencedirect.com The original PDF of the article can be found at Microelectronics Journal website : http://www.sciencedirect.com/science/journal/00262692
HAL Id:hal-03599346
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:Université de Toulouse > Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE)
French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
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Deposited On:12 Sep 2008 09:39

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