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Critical study of the vertical-cavity surface emitting laser electrical access for integrated optical sub-assembly

Rissons, Angélique and Mollier, Jean-Claude Critical study of the vertical-cavity surface emitting laser electrical access for integrated optical sub-assembly. (2009) In: EMC Europe Workshop - International Symposium on Electromagnetic Compatibility, 11-12 June 2009, Athens, Greece .

(Document in English)

PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader

Official URL: http://dx.doi.org/10.1109/EMCEUROPE.2009.5189686


The proposal contribution aims at highlighting the consequence of the impedance mismatching in Vertical-Cavity Surface-Emitting laser (VCSEL)-based optical subassembly for optical interconnection applications. The integration of this micro laser diode needs a particular care to avoid electromagnetic coupling which could transform the advantage of the VCSEL technology in a weakness. Indeed, the vertical emission perpendicular to the active layer gives the possibility to achieve the need of planarization of the optoelectronic circuits and the design of VCSEL arrays. That is why it is of great interest to develop an optoelectronic model including the electrical access effect. This model is based on the VCSEL rate equation comparison with a behavioural small-signal equivalent circuit. Scattering parameters of various VCSEL structures and various VCSEL chip submounts are tested. This characterization allows the validation of the laser model and emphasizes the influence of the electrical access in the light transmission. In a particular VCSEL array structure, a crosstalk phenomenon is also observed. In other cases, the frequency rise involves modification of the laser frequency response. Consequently the electrical access of the VCSEL needs to be improved in order to avoid an inadequate utilization of the VCSEL.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to the Institute of Electrical and Electronics Engineers (IEEE). The original PDF can be found on the IEEE website: http://ieeexplore.ieee.org/
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Laboratory name:
Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Micro-ondes et Optique pour Systèmes Embarqués - MOSE
Deposited On:26 Mar 2009 15:31

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