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Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy

Arinero, Richard and Riedel, Clément and Schwartz, Gustavo Ariel and Lévêque, Gérard and Alegría, Angel and Tordjeman, Philippe and Israeloff, Nathan E. and Ramonda, Michel and Colmenero, Juan Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; 4). Formatex Research Center, Spain, 1963-1977. ISBN 978-84-614-6191-2

(Document in English)

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Several electrostatic force microscopy (EFM) - based methods have been recently developed to study the nanoscale dielectric properties of thin insulating layers. Some methods allow measuring quantitatively the static dielectric permittivity whereas some others provide qualitative information about the temperature-frequency dependence of dielectric properties. In this chapter, all these methods are described and illustrated by experiments on pure and nanostructured polymer films. A section is dedicated to EFM probe - sample models and especially to the Equivalent Charge Method (ECM).

Item Type:Book Section
Additional Information:Thanks to FORMATEX RESEARCH CENTER editor. The definitive version is available at http://www.formatex.org/microscopy4/ The original PDF of the article can be found at FORMATEX RESEARCH CENTER : http://www.formatex.org/microscopy4/chapters3.html
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Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Other partners > Consejo Superior de Investigaciones Científicas - CSIC (SPAIN)
Other partners > Donostia International Physics Center - DIPC (SPAIN)
Université de Toulouse > Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE)
Other partners > Universidad del País Vasco - Euskal Herriko Unibertsitatea - EHU (SPAIN)
Other partners > Université de Montpellier 2 (FRANCE)
Other partners > Northeastern University (USA)
Laboratory name:
Deposited On:04 Mar 2011 09:20

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