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Multilevel RTS in proton irradiated CMOS image sensors manufactured in a deep submicron technology

Goiffon, Vincent and Hopkinson, Gordon R. and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier Multilevel RTS in proton irradiated CMOS image sensors manufactured in a deep submicron technology. (2009) IEEE Transactions on Nuclear Science, 5 (4). 2132-2141 . ISSN 0018-9499

(Document in English)

PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader

Official URL: http://dx.doi.org/10.1109/TNS.2009.2014759


A new automated method able to detect multilevel random telegraph signals (RTS) in pixel arrays and to extract their main characteristics is presented. The proposed method is applied to several proton irradiated pixel arrays manufactured using a 0.18um CMOS process dedicated to imaging. Despite the large proton energy range and the large fluence range used, similar exponential RTS amplitude distributions are observed. A mean maximum amplitude independent of displacement damage dose is extracted from these distributions and the number of RTS defects appears to scale well with total nonionizing energy loss. These conclusions allow the prediction of RTS amplitude distributions. The effect of electric field on RTS amplitude is also studied and no significant relation between applied bias and RTS amplitude is observed.

Item Type:Article
Additional Information:Thanks to the Institute of Electrical and Electronics Engineers (IEEE).The original PDF can be found on the IEEE website : http://ieeexplore.ieee.org/search/wrapper.jsp?arnumber=5204683
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:Other partners > European Space Agency - ESA (UNITED KINGDOM)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Other partners > EADS - Astrium (FRANCE)
Other partners > Surrey Satellite Technology (UNITED KINGDOM)
French research institutions > Centre National d'Études Spatiales - CNES (FRANCE)
Laboratory name:
Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Conception d’Imageurs Matriciels Intégrés - CIMI
Deposited On:04 Sep 2009 10:59

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