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Degradation of the luminance and impedance evolution analysis of an OLED under thermal and electrical stress

Al Haddad, Andrea and Canale, Laurent and Dupuis, Pascal and Picot, Antoine and Zissis, Georges and Maussion, Pascal Degradation of the luminance and impedance evolution analysis of an OLED under thermal and electrical stress. (2019) In: IECON 2019, 14 October 2019 - 17 October 2019 (Lisbon, Portugal).

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Official URL: https://doi.org/10.1109/IECON.2019.8927330

Abstract

Organic light emitting diodes are one of the most innovative light sources. They do not require semiconductor fabrication techniques like the LED family, they are simple to construct and are used in many original applications. The inconvenient of this product is that it does not have a long lasting useful life with more then 10000 hours. Therefore, this paper will present a parametric method to design an aging model of the OLED based on luminance decay and electrical impedance evolution. Accelerated tests using thermal factor and currentdensity will be applied to large warm white OLED panels. A log-normal model for the luminance decay will be merged withdesign of experiments method to include the stress factors as well as impedance characteristics resulting in an effective degradation model that can estimate the lifetime of the OLED.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to IEEE. ©2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The definitive version is available at: https://ieeexplore.ieee.org. This paper appears in IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society. Electronic ISBN:978-1-7281-4878-6. The original PDF is available at: https://ieeexplore.ieee.org/document/8927330.
HAL Id:hal-03113728
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Université de Toulouse > Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE)
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Deposited On:08 Jan 2021 05:22

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