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OLED ageing signature characterization under combined thermal and electrical stresses

Dupuis, Pascal and Alchaddoud, Alaa and Canale, Laurent and Zissis, Georges OLED ageing signature characterization under combined thermal and electrical stresses. (2014) In: 2014 International Symposium on Electrical Insulating Materials, 1 June 2014 - 5 June 2014 (Niigata, Japan).

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Official URL: https://ieeexplore.ieee.org/document/6870781


OLED are appearing at the industrial scale for purposes such as decorative lighting as well as LCD screen back-lighting. One of their main advantages compared to LED is their reduced light intensity: the luminous flux is produced by a much greater surface. Nevertheless there are a number of strong constraints on their allowable operating conditions, which may otherwise dramatically reduce their lifetime. This aspect of OLEDs is up to now not well understood and generally requires the knowledge of the layers and the chemical compounds used to build the device. In this study we submitted commercial OLEDs to limit conditions with respect to their maximum current and temperature. Complete electrical, optical, photometric and thermic characterization was performed on new devices, and repeated at regular intervals during the ageing process. Electrical parameters were measured with a Solartron impedance analyzer and a Keithley Source meter applying current and voltage steps. By the analysis of the indicial response elements of the equivalent linear circuit were extracted. We will illustrate which parameters change the most with the ageing process. The purpose is to predict and quantify the useful lifetime of OLED under electrical and/or thermal stress. Another outcome of importance is related to OLED driver design, namely specifying the end-of-life electrical characteristics. The operating point's significantly drifted from their original values leading sometimes to a doubling of the operating voltage at the same current level.

Item Type:Conference or Workshop Item (Poster)
Additional Information:Thanks to IEEE. ©2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The definitive version is available at: https://ieeexplore.ieee.org. This paper appears in Proceedings of 2014 International Symposium on Electrical Insulating. Electronic ISBN:978-4-8868-6-0866. The original PDF is available at: https://ieeexplore.ieee.org/document/6870781.
HAL Id:hal-02435745
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Université de Toulouse > Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE)
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Deposited On:12 Jan 2021 14:42

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