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Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses

Dewitte, Hugo and Rizzolo, Serena and Paillet, Philippe and Magnan, Pierre and Le Roch, Alexandre and Corbière, Franck and Molina, Romain and Girard, Sylvain and Allanche, Timothé and Muller, Cyprien and Desjonquères, Hortense and Macé, Jean Reynald and Baudu, Jean-Pierre and Saravia Flores, A. and Goiffon, Vincent Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses. (2019) In: Radiation and its Effects on Components and Systems - RADECS 2019, 16 September 2019 - 20 September 2019 (Montpellier, France).

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Official URL: https://doi.org/10.1109/TNS.2020.3001618

Abstract

Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses.

Item Type:Conference or Workshop Item (Other)
Audience (conference):International conference proceedings
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Institution:Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited On:26 Jun 2020 08:10

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