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Electrical propertiesof annealed and coated boron nitride under electron beamirradiation.

Guerch, Kévin and Paulmier, Thierry and Dennison, John Robert and Dekany, Justin and Lenormand, Pascal and Guillemet, Sophie Electrical propertiesof annealed and coated boron nitride under electron beamirradiation. (2015) In: Proceedings of the 13th ISMSE, 22 June 2015 - 26 June 2015 (Pau, France).

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The charging and relaxation kinetics of pyrolytic boron nitride(BN)substrates, BN with an aluminium oxide(BN/Al2O3) coating, and thermally-annealed alumina-coated boron nitride (an-BN/Al2O3) were investigated under low power electron irradiation(5<E0< 20keV,Ji= 10 nA.cm-2 at room temperature)in the CEDRE facility at ONERA (Toulouse, France). Surface potentials of each ceramics configuration were measured over time using the Kelvin probe method. The influence of coating and annealing treatments to limit charging is discussed in this paper. A thorough study of a an–BN/Al2O3 sample was carried out under a critical electron flux (E0= 20 keV, Ji= 750nA.cm-2)in order to assess the degradation kinetics of the material’s electrical properties. The characterisations of an–BN/Al2O3samples were performed before and after electrical aging at CIRIMAT (Toulouse, France) to identify the structural and chemical evolution which would explain this degradation. A chemical deterioration of coating and some contaminants were evidenced after the critical irradiation.

Item Type:Conference or Workshop Item (Paper)
HAL Id:hal-03627879
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Université de Toulouse > Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE)
French research institutions > Office National d'Etudes et Recherches Aérospatiales - ONERA (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE)
Other partners > Utah State University - USU (USA)
Laboratory name:
Deposited On:10 Jan 2020 15:14

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