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Identification of Resistivity Distributions in Dielectric Layers by Measurement Model Analysis of Impedance Spectroscopy

Chen, Yu-Min and Nguyen, Anh Son and Orazem, Mark E. and Tribollet, Bernard and Pébère, Nadine and Musiani, Marco and Vivier, Vincent Identification of Resistivity Distributions in Dielectric Layers by Measurement Model Analysis of Impedance Spectroscopy. (2016) Electrochimica Acta, 219. 312-320. ISSN 0013-4686

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Official URL: https://doi.org/10.1016/j.electacta.2016.09.136

Abstract

The Voigt measurement model, developed in the 1990s for identification of the error structure of impedance measurements, is shown here to have utility in identifying resistivity distributions that give rise to frequency dispersion. The analysis was validated by application to synthetic data derived from a constant–phase–element model, a power–law distribution of resistivity, and an exponential distribution corresponding to a Young impedance. The application to experimental data obtained from coated aluminum demonstrates its utility for interpretation of impedance measurements.

Item Type:Article
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Other partners > Consiglio Nazionale delle Ricerche - CNR (ITALY)
Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE)
Other partners > Sorbonne Université (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE)
Other partners > University of Florida (USA)
Laboratory name:
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Deposited By: Yves MOMBOISSE
Deposited On:07 Jan 2020 09:13

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