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Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions

Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Goiffon, Vincent Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions. (2019) In: 2018 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

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Official URL: http://doi.org/10.1109/TNS.2019.2892645

Abstract

Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions.

Item Type:Conference or Workshop Item (Other)
Additional Information:Thanks to the IEEE (Institute of Electrical and Electronics Engineers). This paper is available at : https://ieeexplore.ieee.org/document/8611120 “© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Audience (conference):International conference proceedings
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Institution:French research institutions > Centre National d'Études Spatiales - CNES (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
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Deposited On:09 Dec 2019 12:58

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