Allanche, Timothé and Goiffon, Vincent
and Rizzolo, Serena and Paillet, Philippe and Chabane, Aziouz and Duhamel, Olivier and Muller, Cyprien and Magnan, Pierre and Clerc, Raphael and Marin, Emmanuel and Boukenter, Aziz and Ouerdane, Youcef and Girard, Sylvain
Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor.
(2017)
In: Radiation and Its Effects on Components and Systems (RADECS 2017), 2 October 2017 - 6 October 2017 (Genève, Switzerland).
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(Document in English)
PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader 906kB |
Abstract
Analysis of X-Ray Photo-Charge Induced Speckles in a Radiation Hardened CMOS Image Sensor.
| Item Type: | Conference or Workshop Item (Poster) |
|---|---|
| Audience (conference): | International conference without published proceedings |
| Uncontrolled Keywords: | |
| Institution: | Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE) |
| Laboratory name: | |
| Statistics: | download |
| Deposited On: | 05 Mar 2019 13:55 |
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