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Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling

Goiffon, Vincent and Rizzolo, Serena and Corbière, Franck and Rolando, Sébastien and Bounasser, Said and Sergent, Marius and Chabane, Aziouz and Marcelot, Olivier and Estribeau, Magali and Magnan, Pierre and Paillet, Philippe and Girard, Sylvain and Gaillardin, Marc and Marcandella, Claude and Allanche, Timothé and Van Uffelen, Marco and Casellas, Laura Mont and Scott, Robin and De Cock, Wouter Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling. (2018) IEEE Transactions on Nuclear Science, 65 (1). 101-110. ISSN 0018-9499

(Document in English)

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Official URL: http://dx.doi.org/10.1109/TNS.2017.2765481


Total ionizing dose effects are studied on a radiation hardened by design (RHBD) 256×256 -pixel CMOS image sensor (CIS) demonstrator developed for ITER remote handling by using X- and γ -ray irradiations. The (color) imaging capabilities of the RHBD CIS are demonstrated up to 10 MGy (SiO2), 1 Grad (SiO2), validating the radiation hardness of most of the designed integrated circuit. No significant sensitivity (i.e., responsivity and color filter transmittance) or readout noise degradation is observed. The proposed readout chain architecture allows achieving a maximum output voltage swing larger than 1 V at 10 MGy (SiO2). The influence of several pixel layout (the gate oxide thickness, the gate overlap distance, and the use of an in-pixel P+ ring) and manufacturing process parameters (photodiode doping profile and process variation) on the radiation-induced dark current increase is studied. The nature of the dark current draining mechanism used to cancel most of the radiation-induced degradation is also discussed and clarified.

Item Type:Article
Additional Information:Thanks to the IEEE (Institute of Electrical and Electronics Engineers). This paper is available at : https://ieeexplore.ieee.org/document/8078236/ “© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:French research institutions > Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE)
French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Other partners > Université Jean Monnet - St Etienne (FRANCE)
Other partners > Fusion for Energy - F4E (SPAIN)
Other partners > Oxford Technologies Ltd. - OTL (UNITED KINGDOM)
Laboratory name:
Deposited On:04 May 2018 13:49

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