Mortagne, Caroline and Incerti, Véronique
and Ledesma Alonso, René
and Ogier, Maëlle
and Risso, Frédéric
and Ondarçuhu, Thierry
and Legendre, Dominique
and Tordjeman, Philippe
Near-field deformation of a liquid interface by atomic force microscopy.
(2017)
Physical Review E, 96 (1). 012802/1-012802/7. ISSN 1539-3755
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(Document in English)
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Official URL: http://dx.doi.org/10.1103/PhysRevE.96.012802
Abstract
We experiment the interaction between a liquid puddle and a spherical probe by Atomic Force Microscopy (AFM) for a probe radius R ranging from 10 nm to 30 μm. We have developed a new experimental setup by coupling an AFM with a high-speed camera and an inverted optical microscope. Interaction force-distance curves (in contact mode) and frequency shift–distance curves (in frequency modulation mode) are measured for different bulk model liquids for which the probe-liquid Hamaker constant Hpl is known. The experimental results, analyzed in the frame of the theoretical model developed in Phys. Rev. Lett. 108, 106104 (2012) and Phys. Rev. E 85, 061602 (2012), allow to determine the “jump-to-contact” critical distance dmin below which the liquid jumps and wets the probe. Comparison between theory and experiments shows that the probe-liquid interaction at nanoscale is controlled by the liquid interface deformation. This work shows a very good agreement between the theoretical model and the experiments and paves the way to experimental studies of liquids at the nanoscale.
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