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An Analog-to-Digital Converter Immunity Modelling based on a Stochastic Approach

Hairoud Airieau, Siham and Dubois, Tristan and Duchamp, Geneviève and Durier, André An Analog-to-Digital Converter Immunity Modelling based on a Stochastic Approach. (2017) In: EMC Europe 2017, 4 September 2017 - 8 September 2017 (Angers, France).

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Official URL: http://dx.doi.org/10.1109/EMCEurope.2017.8094670


This paper proposes a methodology to model an electronic board according to a bottom-up approach. This method is applied to build the model of a synchronous buck DC-DC converter board for conducted emission prediction purpose. The different steps to select the model terminals and the construction of the component and PCB interconnect models are described.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to IEEE. The original document is available on IEEE Xplore :http://dx.doi.org/10.1109/EMCEurope.2017.8094670 .2008.4677220.© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
HAL Id:hal-01655915
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Other partners > Institut Polytechnique de Bordeaux - IPB (FRANCE)
Other partners > Bordeaux Sciences Agro (FRANCE)
Other partners > IRT Saint Exupéry - Institut de Recherche Technologique (FRANCE)
Other partners > Université de Bordeaux (FRANCE)
Laboratory name:
Deposited On:05 Dec 2017 10:47

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