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Influence of PWM methods in semiconductor losses of 15kVA three-phase SiC inverter for aircraft applications

Cougo, Bernardo and Tran, Duc-Hoan and Segond, Gilles and Hilal, Alaa Influence of PWM methods in semiconductor losses of 15kVA three-phase SiC inverter for aircraft applications. (2017) In: EPE (18th International Conference on Electronic Power Engineering), 11 September 2017 - 14 September 2017 (Varsow, Poland).

(Document in English)

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Official URL: http://dx.doi.org/10.23919/EPE17ECCEEurope.2017.8099043


In near future, modern aircrafts will be more electrical, having more power converters in different applications. Inverters is one of the most common applications, which are used in actuators, cabin pressurization, among others. In order to significantly reduce weight, size and losses of these converters, disruptive technology such as Wide Bandgap components (SiC and GaN transistors) should be used. In this paper, we study the influence of SiC components in a 540V/15kVA inverter for motor driving applications. The approach proposed here starts by the dynamic characterization of SiC modules with the aim of obtaining accurate switching energies in order to precisely calculate semiconductor losses in three-phase inverters. Then, precise conduction and switching loss calculation is developed to verify the influence of PWM methods on losses of this converter. A generic 15kVA inverter setup is built. Experimental results in this setup confirm the characterization and loss calculation and shows the best PWM methods for specific aircraft applications.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to IEEE. The original document is available on IEEE Xplore : https://ieeexplore.ieee.org/document/8099043/ © 2017 . Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution
HAL Id:hal-01772124
Audience (conference):International conference proceedings
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Institution:Other partners > IRT Saint Exupéry - Institut de Recherche Technologique (FRANCE)
Deposited On:20 Apr 2018 08:41

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