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Variable Importance Assessment in Lifespan Models of Insulation Materials: A Comparative Study

Salameh, Farah and Picot, Antoine and Chabert, Marie and Leconte, Eve and Ruiz-Gazen, Anne and Maussion, Pascal Variable Importance Assessment in Lifespan Models of Insulation Materials: A Comparative Study. (2015) In: 10th IEEE International Symposium on Diagnostics, Power Electronics and Drives (SDEMPED 2015), 1 September 2015 - 4 September 2015 (Guarda, Portugal).

(Document in English)

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Official URL: http://dx.doi.org/10.1109/DEMPED.2015.7303690


This paper presents and compares different methods for evaluating the relative importance of variables involved in insulation lifespan models. Parametric and non-parametric models are derived from accelerated aging tests on twisted pairs covered with an insulating varnish under different stress constraints (voltage, frequency and temperature). Parametric models establish a simple stress-lifespan relationship and the variable importance can be evaluated from the estimated parameters. As an alternative approach, non-parametric models explain the stress-lifespan relationship by means of regression trees or random forests (RF) for instance. Regression trees naturally provide a hierarchy between the variables. However, they suffer from a high dependency with respect to the training set. We show that RF provide a more robust model while allowing a quantitative variable importance assessment. Comparisons of the different models are performed on different training and test sets obtained through experiments.

Item Type:Conference or Workshop Item (Paper)
Additional Information:Thanks to IEEE editor. The definitive version is available at http://ieeexplore.ieee.org This papers appears in Proceedings of 10th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives. ISBN: 978-1-4799-7743-7 The original PDF of the article can be found at: http://ieeexplore.ieee.org/document/7303690/?reload=true&arnumber=7303690 Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
HAL Id:hal-01375415
Audience (conference):International conference proceedings
Uncontrolled Keywords:
Institution:French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE)
Université de Toulouse > Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE)
Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE)
Université de Toulouse > Université Toulouse - Jean Jaurès - UT2J (FRANCE)
Université de Toulouse > Université Toulouse 1 Capitole - UT1 (FRANCE)
Other partners > Mines ParisTech (FRANCE)
Laboratory name:
Deposited On:15 Sep 2016 13:52

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