Picot, Antoine and Malec, David and Chabert, Marie
and Maussion, Pascal
Lifespan Modeling of Low Voltage Machines Insulation Materials.
(2015)
European Journal of Electrical Engineering, 17 (5-6). 291-306. ISSN 2103-3641
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(Document in English)
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Official URL: http://ejee.revuesonline.com/article.jsp?articleId=35619
Abstract
This paper deals with the modeling of insulation material lifespan in a partial discharge regime. Accelerated aging tests are carried out to determine the lifespan of polyester-imide insulation films under different various stress conditions. The insulation lifespan logarithm is modeled as a function of different factors: the electrical and frequency stress logarithms and an exponential form of the temperature. The model parameters are estimated on a training set. The significance of the factors is evaluated through the analysis of variance (ANOVA). In a first step, the design of experiments method (DoE) is considered. The associated lifespan model is linear with respect to the factors. This method is well known for reducing the number of experiments while providing a good accuracy. In a second step, the response surface method (RSM) is considered. This method takes also into account some second order terms and thus possible interactions between the stress factors. Performance of the two methods are analyzed and compared on a test set.
Item Type: | Article |
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HAL Id: | hal-03518908 |
Audience (journal): | International peer-reviewed journal |
Uncontrolled Keywords: | |
Institution: | Université de Toulouse > Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE) French research institutions > Centre National de la Recherche Scientifique - CNRS (FRANCE) Université de Toulouse > Université Toulouse III - Paul Sabatier - UT3 (FRANCE) Université de Toulouse > Université Toulouse - Jean Jaurès - UT2J (FRANCE) Université de Toulouse > Université Toulouse 1 Capitole - UT1 (FRANCE) |
Laboratory name: | |
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Deposited On: | 29 Feb 2016 13:44 |
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