OATAO - Open Archive Toulouse Archive Ouverte Open Access Week

Study of CCD Transport on CMOS Imaging Technology: Comparison Between SCCD and BCCD, and Ramp Effect on the CTI

Marcelot, Olivier and Estribeau, Magali and Goiffon, Vincent and Martin-Gonthier, Philippe and Corbière, Franck and Molina, Romain and Rolando, Sébastien and Magnan, Pierre Study of CCD Transport on CMOS Imaging Technology: Comparison Between SCCD and BCCD, and Ramp Effect on the CTI. (2014) IEEE Transactions on Electron Devices, 61 (3). 844-849. ISSN 0018-9383

(Document in English)

PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader

Official URL: http://dx.doi.org/10.1109/TED.2014.2298693


This paper presents measurements performed on Charge Coupled Device (CCD) structures manufactured on a deep submicron CMOS imaging technology, in surface channel CCD and in buried channel CCD mode. The charge transfer inefficiency is evaluated for both CCD modes with regard to the injected charge, and the influence of the rising and falling time effect is explored. Controlling the ramp and especially reducing its abruptness allows to get much lower CTI in BCCD mode. In contrary, we did not observe any effect of the ramp on SCCD mode, due to the presence of interface traps at the silicon – oxide interface.

Item Type:Article
Additional Information:Thanks to IEEE editor. (c) 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works. The definitive version is available at http://ieeexplore.ieee.org
HAL Id:hal-00991418
Audience (journal):International peer-reviewed journal
Uncontrolled Keywords:
Institution:Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)
Laboratory name:
Département d'Electronique, Optronique et Signal - DEOS (Toulouse, France) - Conception d’Imageurs Matriciels Intégrés - CIMI
Deposited On:15 May 2014 09:53

Repository Staff Only: item control page