Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Rolland, Guy and Petit, Sophie Single Event Effects in 4T and 5T Pinned Photodiode CMOS Image Sensors. (2013) In: 3rd Workshop on CMOS Image Sensors for High Performance Applications, 26 November 2013 - 27 November 2013 (Toulouse, France). (Unpublished)
|
(Document in English)
PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader 3MB |
Abstract
Single Event Effects in 4T and 5T Pinned Photodiode CMOS Image Sensors
Item Type: | Conference or Workshop Item (Other) |
---|---|
Audience (conference): | National conference without published proceedings |
Uncontrolled Keywords: | |
Institution: | French research institutions > Centre National d'Études Spatiales - CNES (FRANCE) Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE) |
Laboratory name: | |
Statistics: | download |
Deposited On: | 06 Jan 2015 13:50 |
Repository Staff Only: item control page