Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Cervantes, Paola and Corbière, Franck and Estribeau, Magali Radiation Damages in CMOS Active Pixel Sensors. (2011) In: OSA Imaging Systems and Applications, 10 July 2011 - 14 July 2011 (Toronto, Canada).
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Official URL: http://dx.doi.org/10.1364/ISA.2011.IMA3
Abstract
This paper presents a summary of the main results we observed on irradiated custom imagers manufactured using 0.18 um CMOS processes dedicated to imaging. Several types of energetic particles have been used (gamma rays, X-rays, protons and neutrons) to irradiate the studied devices. Both total ionizing dose (TID) and displacement damage effects are reported. The most sensitive parameter is still the dark current.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Imaging and Applied Optics, OSA Technical Digest (CD) (Optical Society of America, 2011, ISBN : 978-1-55752-914-5 |
| Audience (conference): | International conference proceedings |
| Uncontrolled Keywords: | |
| Institution: | Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE) |
| Laboratory name: | |
| Statistics: | download |
| Deposited By: | Vincent Goiffon |
| Deposited On: | 23 Sep 2014 10:43 |
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