Magnan, Pierre and Goiffon, Vincent Ionization Effects in CMOS Imagers. (2010) In: Fraunhofer IMS Workshop on CMOS Imaging, 4 May 2010 - 5 May 2010 (Duisburg, Germany). (Unpublished)
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Abstract
Ionization Effects in CMOS Imagers
| Item Type: | Conference or Workshop Item (Other) |
|---|---|
| Audience (conference): | International conference without published proceedings |
| Uncontrolled Keywords: | |
| Institution: | Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE) |
| Laboratory name: | |
| Statistics: | download |
| Deposited By: | Vincent Goiffon |
| Deposited On: | 23 Sep 2014 14:45 |
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