Magnan, Pierre and Goiffon, Vincent Ionization Effects in CMOS Imagers. (2010) In: Fraunhofer IMS Workshop on CMOS Imaging, 4 May 2010 - 5 May 2010 (Duisburg, Germany). (Unpublished)
![]() |
(Document in English)
PDF (Author's version) - Depositor and staff only - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader 3MB |
Abstract
Ionization Effects in CMOS Imagers
Item Type: | Conference or Workshop Item (Other) |
---|---|
Audience (conference): | International conference without published proceedings |
Uncontrolled Keywords: | |
Institution: | Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE) |
Laboratory name: | |
Statistics: | download |
Deposited By: | Vincent Goiffon |
Deposited On: | 23 Sep 2014 14:45 |
Repository Staff Only: item control page