Magnan, Pierre and Goiffon, Vincent Ionization Effects in CMOS Imagers. (2010) In: Fraunhofer IMS Workshop on CMOS Imaging, 4 May 2010 - 5 May 2010 (Duisburg, Germany). (Unpublished)
![[img]](https://oatao.univ-toulouse.fr/style/images/fileicons/application_pdf.png) |
(Document in English)
PDF (Author's version) - Depositor and staff only - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader 3MB |
Abstract
Ionization Effects in CMOS Imagers
| Item Type: | Conference or Workshop Item (Other) |
|---|---|
| Audience (conference): | International conference without published proceedings |
| Uncontrolled Keywords: | |
| Institution: | Université de Toulouse > Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE) |
| Laboratory name: | |
| Statistics: | download |
| Deposited On: | 23 Sep 2014 14:45 |
Repository Staff Only: item control page
