Sagnes, Mathieu and Broto, Jean-Marc and Raquet, Bertrand and Ondarçuhu, Thierry and Laurent, Christophe and Flahaut, Emmanuel and Vieu, Christophe and Carcenac, Franck Alignment and nano-connections of isolated carbon nanotubes. (2003) Microelectronic Engineering, 67-68. 683-689. ISSN 0167-9317
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(Document in English)
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Official URL: http://dx.doi.org/10.1016/S0167-9317(03)00130-8
Abstract
We report a new approach for the alignment and the electrical nano-connection of isolated carbon nanotubes (CNTs). Through a novel combination of proven technics, we have been able to align isolated carbon nanotubes and selectively contact those CNTs by high resolution electron beam lithography (HREBL). Resistance versus temperature (R(T)) experiments have been carried out to determine the reliability of the metal–CNTs interface and to probe the electronic conductance of the CNT.
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