Parent, Guillaume and Massiot, Gregor and Rouet, Vincent and Munier, Catherine and Vidal, Paul-Etienne and Carrillo, Francisco Javier
Towards a reliability analysis method of wide band gap power electronic components and modules.
(2013)
In: European Microelectronics and Packaging Conference , 9 September 2013 - 12 September 2013 (Grenoble, France).
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(Document in English)
PDF (Author's version) - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader 502kB |
Abstract
This study is addressing on the reliability of COTS (Commercial Off-The-Shelf) power electronic components and modules which could be used in high reliability systems such as aerospace systems. This paper details the first followed steps to achieve a reliability assessment of some COTS power devices. These first steps are: - Construction analyses for the determination of the packaging assembly technologies of COTS power devices; - Discussion on the material used in COTS power devices; - Synthesis of the potential failure risk analysis under harsh environments; - Determination of several accelerated ageing tests to check the potential failure modes and mechanisms in power electronic for aerospace systems.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Additional Information: | Thanks to IEEE Xplore editor. The definitive version is available at : http://ieeexplore.ieee.org/Xplore/home.jsp |
| HAL Id: | hal-00952707 |
| Audience (conference): | International conference proceedings |
| Uncontrolled Keywords: | |
| Institution: | Université de Toulouse > Institut National Polytechnique de Toulouse - INPT (FRANCE) Other partners > European Aeronautic Defence and Space company - EADS (FRANCE) |
| Laboratory name: | |
| Statistics: | download |
| Deposited By: | Francisco Carrillo |
| Deposited On: | 07 Feb 2014 15:43 |
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