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Items where Person is "Rolland, Guy"

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Number of items: 17.

Article

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Rolland, Guy and Petit, Sophie Single Event Effects in 4T Pinned Photodiode Image Sensors. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 6). pp. 4314 -4322. ISSN 0018-9499

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Rolland, Guy and Petit, Sophie Single Event Effects in CMOS Image Sensors. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 4). pp. 2494-2502. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy and Bardoux, Alain Similarities Between Proton and Neutron Induced Dark Current Distribution in CMOS Image Sensors. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 4). pp. 927-936. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Girard, Sylvain and Petit, Sophie and Rolland, Guy and Bardoux, Alain Total ionizing dose versus displacement damage dose induced dark current random telegraph signals in CMOS image sensors. (2011) IEEE Transactions on Nuclear Science, vol. 58 (n° 6). pp. 3085-3094. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Inguimbert, Christophe and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology. (2010) IEEE Transactions on Nuclear Science, vol. 57 (n° 6). pp. 3101-3108. ISSN 0018-9499

Goiffon, Vincent and Hopkinson, Gordon R. and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier Multilevel RTS in proton irradiated CMOS image sensors manufactured in a deep submicron technology. (2009) IEEE Transactions on Nuclear Science, vol. 5 (n° 4). pp. 2132-2141 . ISSN 0018-9499

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy Ionization versus displacement damage effects in proton irradiated CMOS sensors manufactured in deep submicron process. (2009) Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment, vol. 610 (n° 1). pp. 225-229. ISSN 0168-9002

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy Total dose evaluation of deep submicron CMOS imaging technology through elementary device and pixel array behavior analysis. (2008) IEEE Transactions on Nuclear Science, vol. 5 (n° 6). pp. 3494-3501. ISSN 0018-9499

Conference or Workshop Item

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Rolland, Guy and Petit, Sophie Single Event Effects in 4T Pinned Photodiode Image Sensors. (2013) In: 50th IEEE Nuclear and Space Radiation Effects Conference (NSREC), 8 July 2013 - 12 July 2013 (San Francisco, United States).

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy Influence of Displacement Damage Dose on Dark Current Distribution of Irradiated CMOS Image Sensors. (2011) In: 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2011), 19 September 2011 - 23 September 2011 (Sevilla, Spain).

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Inguimbert, Christophe and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Displacement Damage Effect Due to Neutron and Proton Irradiations on CMOS Image Sensors Manufactured in Deep Sub-Micron Technology. (2010) In: Nuclear and Space Radiation Effects Conference (NSREC), 19 July 2010 - 23 July 2010 (Denver, United States). (Unpublished)

Goiffon, Vincent and Hopkinson, Gordon R. and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier Multi level RTS in proton irradiated CMOS image sensors manufactured in deep submicron technology. (2008) In: Radiation Effects on Components and Systems - RADECS, 10 September 2008 - 12 September 2008 (Jyväskylä, Finland). (Unpublished)

Goiffon, Vincent and Magnan, Pierre and Bernard, Frédéric and Rolland, Guy and Saint-Pé, Olivier and Huger, Nicolas and Corbière, Franck Ionizing radiation effects on CMOS imagers manufactured in deep submicron process. (2008) In: SPIE Electronic Imaging 2008 : Sensors, Cameras, and Systems for Industrial/Scientific Applications IX, 27-31 Jan 2008, San Jose, United States .

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy Ionization versus displacement damage effects in proton irradiated CMOS sensor manufactured in deep submicron process. (2008) In: New Developments In Photodetection (NDIP), 15 June 2008 - 20 June 2008 (Aix-les-Bains, France). (Unpublished)

Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Bernard, Frédéric and Rolland, Guy Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior Analysis. (2008) In: Nuclear and Space Radiation Effects Conference (NSREC), 14 July 2008 - 18 July 2008 (Tucson, United States). (Unpublished)

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy and Bardoux, Alain Influence of displacement damage dose on dark current distributions of irradiated CMOS image sensors. In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain .

Book Section

Djité, Ibrahima and Magnan, Pierre and Estribeau, Magali and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Theoretical evaluation of MTF and charge collection efficiency in CCD and CMOS image sensor. (2009) In: Optical Modeling and Performance Predictions IV : 5 - 6 August 2009, San Diego, California, United States. (Proceedings of the Spie ). Spie, Bellingham, United States. ISBN 978-0-8194-7717-0

This list was generated on Thu Oct 23 01:29:41 2014 CEST.