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Items where Person is "Riedel, C."
Group by: Item Type | No Grouping Number of items: 1. Arinero, R. and Riedel, C. and Schwartz, G.A. and Lévêque, G. and Alegria, A. and Tordjeman, Ph. and Israeloff, N.E. and Ramonda, M. and Colmenero, J. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2 |
