| Login | Create Account |
Items where Person is "Pinel, Philippe"
Group by: Item Type | No Grouping Jump to: Conference or Workshop Item Number of items: 1.
Conference or Workshop ItemGoiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Corbière, Franck and Estribeau, Magali and Pinel, Philippe Radiation damages in CMOS image sensors: testing and hardening challenges brought by deep sub-micrometer CIS processes. (2010) In: SPIE Remote Sensing, 20 - 23 Sept 2010, Toulouse, France. |
