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Items where Person is "Petit, Sophie"

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Number of items: 8.

Article

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Rolland, Guy and Petit, Sophie Single Event Effects in 4T Pinned Photodiode Image Sensors. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 6). pp. 4314 -4322. ISSN 0018-9499

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Rolland, Guy and Petit, Sophie Single Event Effects in CMOS Image Sensors. (2013) IEEE Transactions on Nuclear Science . ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy and Bardoux, Alain Similarities Between Proton and Neutron Induced Dark Current Distribution in CMOS Image Sensors. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 4). pp. 927-936. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Saint-Pé, Olivier and Girard, Sylvain and Petit, Sophie and Rolland, Guy and Bardoux, Alain Total ionizing dose versus displacement damage dose induced dark current random telegraph signals in CMOS image sensors. (2011) IEEE Transactions on Nuclear Science, vol. 58 (n° 6). pp. 3085-3094. ISSN 0018-9499

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Inguimbert, Christophe and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology. (2010) IEEE Transactions on Nuclear Science, vol. 57 (n° 6). pp. 3101-3108. ISSN 0018-9499

Book Section

Djité, Ibrahima and Magnan, Pierre and Estribeau, Magali and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Theoretical evaluation of MTF and charge collection efficiency in CCD and CMOS image sensor. (2009) In: Optical Modeling and Performance Predictions IV : 5 - 6 August 2009, San Diego, California, United States. (Proceedings of the Spie ). Spie, Bellingham, United States. ISBN 978-0-8194-7717-0

Conference or Workshop Item

Lalucaa, Valerian and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Rolland, Guy and Petit, Sophie Single Event Effects in 4T Pinned Photodiode Image Sensors. (2013) In: 50th IEEE Nuclear and Space Radiation Effects Conference (NSREC), 08 July 2013 - 12 July 2013 (San Francisco, United States).

Virmontois, Cédric and Goiffon, Vincent and Magnan, Pierre and Girard, Sylvain and Saint-Pé, Olivier and Petit, Sophie and Rolland, Guy and Bardoux, Alain Influence of displacement damage dose on dark current distributions of irradiated CMOS image sensors. In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain .

This list was generated on Sat Apr 19 04:38:11 2014 CEST.