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Items where Person is "Paillet, Philippe"

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Article

Raine, Mélanie and Goiffon, Vincent and Girard, Sylvain and Rousseau, Adrien and Gaillardin, Marc and Paillet, Philippe and Duhamel, Olivier and Virmontois, Cédric Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 6). pp. 4297-4304. ISSN 0018-9499

Gaillardin, Marc and Goiffon, Vincent and Marcandella, Claude and Girard, Sylvain and Martinez, Martial and Paillet, Philippe and Magnan, Pierre and Estribeau, Magali Radiation Effects in CMOS Isolation Oxides: Differences and Similarities With Thermal Oxides. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 4). pp. 2623-2629. ISSN 0018-9499

Goiffon, Vincent and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Chabane, Aziouz and Rousseau, Adrien and Darbon, Stéphane and Cervantes, Paola and Bourgade, Jean-Luc Mitigation technique for use of CMOS image sensors in megajoule class laser radiative environment. (2012) IEEE Electronics Letters , vol. 48 (n° 21). pp. 1338-1339. ISSN 0013-5194

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Place, Sébastien and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Estribeau, Magali and Martin-Gonthier, Philippe Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2012) IEEE Transactions on Nuclear Science, 59 (4). pp. 918-926. ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 6). pp. 2878-2887. ISSN 0018-9499

Goiffon, Vincent and Girard, Sylvain and Magnan, Pierre and Chabane, Aziouz and Paillet, Philippe and Cervantes, Paola and Martin-Gonthier, Philippe and Baggio, Jacques and Estribeau, Magali and Bourgade, Jean-Luc and Darbon, Stéphane and Rousseau, Adrien and Glebov, Vladimir Yu and Pien, Gregory and Sangster, Thomas C. Vulnerability of CMOS image sensors in megajoule class laser harsh environment. (2012) Optics Express, vol. 20 (n° 18). pp. 20028-20042. ISSN 1094-4087

Gaillardin, Marc and Goiffon, Vincent and Girard, Sylvain and Martinez, Martial and Magnan, Pierre and Paillet, Philippe Enhanced Radiation-Induced Narrow Channel Effects in Commercial 0.18 μm Bulk Technology. (2011) IEEE Transactions on Nuclear Science, Vol. 58 (p. 6). pp. 2807-2815. ISSN 0018-9499

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Girard, Sylvain and Paillet, Philippe Analysis of total dose-induced dark current in CMOS image sensors from interface state and trapped charge density measurements. (2010) IEEE Transactions on Nuclear Science, vol. 57 (n° 6). pp. 3087-3094. ISSN 0018-9499

Conference or Workshop Item

Rousseau, Adrien and Darbon, Stéphane and Paillet, Philippe and Girard, Sylvain and Bourgade, Jean-Luc and Raine, Mélanie and Duhamel, Olivier and Goiffon, Vincent and Magnan, Pierre and Chabane, Aziouz and Cervantes, Paola and Hamel, Matthieu and Larour, Jean Nuclear background effects on plasma diagnostics for megajoule class laser facility. (2013) In: SPIE Optics+Photonics, 25 August 2013 - 29 August 2013 (San Diego, California, United States).

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Martin-Gonthier, Philippe Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2011) In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain .

This list was generated on Tue Apr 15 16:00:59 2014 CEST.