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Items where Person is "Gaillardin, Marc"

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Number of items: 18.

Article

Gaillardin, Marc and Martinez, Martial and Girard, Sylvain and Goiffon, Vincent and Paillet, Philippe and Leray, Jean-Luc and Magnan, Pierre and Ouerdane, Youcef and Boukenter, Aziz and Marcandella, Claude and Duhamel, Olivier and Raine, Mélanie and Richard, Nicolas and Andrieu, F. and Barraud, S. and Faynot, O. High Total Ionizing Dose and Temperature Effects on Micro- and Nano-Electronic Devices. (2015) IEEE Transactions on Nuclear Science, vol. 62 (n° 3). pp.1226-1232. ISSN 0018-9499

Paillet, Philippe and Goiffon, Vincent and Chabane, Aziouz and Girard, Sylvain and Rousseau, Adrien and Darbon, Stéphane and Duhamel, Olivier and Raine, Mélanie and Cervantes, Paola and Gaillardin, Marc and Bourgade, Jean-Luc and Magnan, Pierre and Glebov, Vladimir Yu and Pien, Gregory Hardening approach to use CMOS image sensors for fusion by inertial confinement diagnostics. (2013) IEEE Transactions on Nuclear Science, vol.60 (n° 6). pp. 4349-4355. ISSN 0018-9499

Raine, Mélanie and Goiffon, Vincent and Girard, Sylvain and Rousseau, Adrien and Gaillardin, Marc and Paillet, Philippe and Virmontois, Cédric Modeling Approach for the Prediction of Transient and Permanent Degradations of Image Sensors in Complex Radiation Environments. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 6). pp. 4297-4304. ISSN 0018-9499

Gaillardin, Marc and Goiffon, Vincent and Marcandella, Claude and Girard, Sylvain and Martinez, Martial and Paillet, Philippe and Magnan, Pierre and Estribeau, Magali Radiation Effects in CMOS Isolation Oxides: Differences and Similarities With Thermal Oxides. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 4). pp. 2623-2629. ISSN 0018-9499

Gaillardin, Marc and Goiffon, Vincent and Magnan, Pierre High total ionizing dose and temperature effects on micro- and nano-electronic devices. (2013) Proceedings of Advancements in Nuclear Instrumentation Measurement Methods and their Applications (ANIMMA), 2013 3rd International Conference on. pp.1-6.

Girard, Sylvain and Mescia, Luciano and Vivona, Marilena and Laurent, Arnaud and Ouerdane, Youcef and Marcandella, Claude and Prudenzano, Francesco and Boukenter, Aziz and Robin, Thierry and Paillet, Philippe and Goiffon, Vincent and Gaillardin, Marc and Cadier, Benoît and Pinsard, Emmanuel and Cannas, Marco and Boscaino, Roberto Design of Radiation-Hardened Rare-Earth Doped Amplifiers Through a Coupled Experiment/Simulation Approach. (2013) Journal of Lightwave Technology (JLT), vol. 31 (n° 8). pp. 1247-1254. ISSN 0733-8724

Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Goiffon, Vincent and Marcandella, Claude and Martinez, Martial and Raine, Mélanie Investigations on the Vulnerability of Advanced CMOS Technologies to MGy Dose Environments. (2013) IEEE Transactions on Nuclear Science, vol.60 (n°4). pp. 2590-2597. ISSN 0018-9499

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Place, Sébastien and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Estribeau, Magali and Martin-Gonthier, Philippe Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2012) IEEE Transactions on Nuclear Science, 59 (4). pp. 918-926. ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 6). pp. 2878-2887. ISSN 0018-9499

Gaillardin, Marc and Goiffon, Vincent and Girard, Sylvain and Martinez, Martial and Magnan, Pierre and Paillet, Philippe Enhanced Radiation-Induced Narrow Channel Effects in Commercial 0.18 μm Bulk Technology. (2011) IEEE Transactions on Nuclear Science, Vol. 58 (p. 6). pp. 2807-2815. ISSN 0018-9499

Goiffon, Vincent and Magnan, Pierre and Martin-Gonthier, Philippe and Virmontois, Cédric and Gaillardin, Marc Evidence of a novel source of random telegraph signal in CMOS image sensors. (2011) IEEE Electron Device Letters, vol. 32 (n° 6). pp. 773-775. ISSN 0741-3106

Conference or Workshop Item

Goiffon, Vincent and Corbière, Franck and Rolando, Sébastien and Estribeau, Magali and Avon, Barbara and Magnan, Pierre and Baer, Jeremy and Molina, Romain and Chabane, Aziouz and Cervantes, Paola and Gaillardin, Marc and Paillet, Philippe and Marcandella, Claude and Girard, Sylvain Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and X/Gamma Rays Total Ionizing Dose Tests. (2015) In: Proceedings of Nuclear and Space Radiation Effects Conference (NSREC), 13 July 2015 - 17 July 2015 (Boston, United States).

Belloir, Jean-Marc and Goiffon, Vincent and Magnan, Pierre and Virmontois, Cédric and Gilard, Olivier and Raine, Mélanie and Paillet, Philippe and Duhamel, Olivier and Gaillardin, Marc Pixel Pitch and Particle Energy Influence on the Dark Current Distribution of Neutron Irradiated CMOS Image Sensors. (2015) In: IEEE Nuclear & Space Radiation Effects Conference (NSREC 2015), 13 July 2015 - 17 July 2015 (Boston, United States).

Girard, Sylvain and Goiffon, Vincent and Paillet, Philippe and Lépine, Thierry and Corbière, Franck and Rolando, Sébastien and Boukenter, Aziz and Alanche, Timothé and Duhamel, Olivier and Molina, Romain and Estribeau, Magali and Avon, Barbara and Baer, Jérémy and Gaillardin, Marc and Raine, Mélanie and Magnan, Pierre and Ouerdane, Youcef Multi-MGy Radiation Hardened Camera for Nuclear Facilities. (2015) In: Proceedings of Advancements in Nuclear Instrumentation Measurement Methods and their Applications, 20 April 2015 - 24 April 2015 (Lisbon, Portugal).

Raine, Mélanie and Goiffon, Vincent and Paillet, Philippe and Duhamel, Olivier and Girard, Sylvain and Gaillardin, Marc and Virmontois, Cédric and Belloir, Jean-Marc and Richard, Nicolas and Magnan, Pierre Exploring the Kinetics of Formation and Annealing of Single Particle Displacement Damage in Microvolumes of Silicon. (2014) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC), 14 July 2014 - 18 July 2014 (Paris, France).

Goiffon, Vincent and Estribeau, Magali and Cervantes, Paola and Molina, Romain and Gaillardin, Marc and Magnan, Pierre Influence of Transfer Gate Design and Bias on the Radiation Hardness of Pinned Photodiode CMOS Image Sensors. (2014) In: Proceedings of Nuclear and Space Radiation Effects Conference (NSREC) 2014, 14 July 2014 - 18 July 2014 (Paris, France). (Unpublished)

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects on Pinned Photodiode CMOS Image Sensors: Overview of Pixel Performance Degradation Due to Total Ionizing Dose. (2012) In: Workshop on Radiation Effects in Optoelectronic Detectors, 28 November 2012 - 29 November 2012 (Toulouse, France). (Unpublished)

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Martin-Gonthier, Philippe Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2011) In: Radiation Effects on Components and Systems Conference, 19-23 Sept. 2011, Sevilla, Spain .

This list was generated on Thu Jun 30 21:26:46 2016 CEST.