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Items where Person is "Estribeau, Magali"

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Goiffon, Vincent and Estribeau, Magali and Michelot, Julien and Cervantes, Paola and Pelamatti, Alice and Marcelot, Olivier and Magnan, Pierre Pixel Level Characterization of Pinned Photodiode and Transfer Gate Physical Parameters in CMOS Image Sensors. (2014) IEEE Journal of the Electron Devices Society, vol. 2 (n° 4). pp. 65-76. ISSN 2168-6734

Marcelot, Olivier and Estribeau, Magali and Goiffon, Vincent and Martin-Gonthier, Philippe and Corbière, Franck and Molina, Romain and Rolando, Sébastien and Magnan, Pierre Study of CCD Transport on CMOS Imaging Technology: Comparison Between SCCD and BCCD, and Ramp Effect on the CTI. (2014) IEEE Transactions on Electron Devices, vol. 61 (n° 3). pp. 844-849. ISSN 0018-9383

Gaillardin, Marc and Goiffon, Vincent and Marcandella, Claude and Girard, Sylvain and Martinez, Martial and Paillet, Philippe and Magnan, Pierre and Estribeau, Magali Radiation Effects in CMOS Isolation Oxides: Differences and Similarities With Thermal Oxides. (2013) IEEE Transactions on Nuclear Science, vol. 60 (n° 4). pp. 2623-2629. ISSN 0018-9499

Pelamatti, Alice and Goiffon, Vincent and Estribeau, Magali and Cervantes, Paola and Magnan, Pierre Estimation and Modeling of the Full Well Capacity in Pinned Photodiode CMOS Image Sensors. (2013) IEEE Electron Device Letters, vol. 34 (n° 7). pp. 900-902. ISSN 0741-3106

Goiffon, Vincent and Michelot, Julien and Magnan, Pierre and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Pelamatti, Alice and Martin-Gonthier, Philippe On The Pixel Level Estimation of Pinning Voltage, Pinned Photodiode Capacitance and Transfer Gate Channel Potential. (2013) In: International Image Sensor Workshop (IISW 2013), 12 June 2013 - 16 June 2013 (Snowbird Resort, Utah, United States).

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects on Pinned Photodiode CMOS Image Sensors: Overview of Pixel Performance Degradation Due to Total Ionizing Dose. (2012) In: Workshop on Radiation Effects in Optoelectronic Detectors, 28 November 2012 - 29 November 2012 (Toulouse, France). (Unpublished)

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Place, Sébastien and Gaillardin, Marc and Girard, Sylvain and Paillet, Philippe and Estribeau, Magali and Martin-Gonthier, Philippe Identification of radiation induced dark current sources in pinned photodiode CMOS image sensors. (2012) IEEE Transactions on Nuclear Science, 59 (4). pp. 918-926. ISSN 0018-9499

Goiffon, Vincent and Estribeau, Magali and Marcelot, Olivier and Cervantes, Paola and Magnan, Pierre and Gaillardin, Marc and Virmontois, Cédric and Martin-Gonthier, Philippe and Molina, Romain and Corbière, Franck and Girard, Sylvain and Paillet, Philippe and Marcandella, Claude Radiation Effects in Pinned Photodiode CMOS Image Sensors: Pixel Performance Degradation Due to Total Ionizing Dose. (2012) IEEE Transactions on Nuclear Science, vol. 59 (n° 6). pp. 2878-2887. ISSN 0018-9499

Goiffon, Vincent and Girard, Sylvain and Magnan, Pierre and Chabane, Aziouz and Paillet, Philippe and Cervantes, Paola and Martin-Gonthier, Philippe and Baggio, Jacques and Estribeau, Magali and Bourgade, Jean-Luc and Darbon, Stéphane and Rousseau, Adrien and Glebov, Vladimir Yu and Pien, Gregory and Sangster, Thomas C. Vulnerability of CMOS image sensors in megajoule class laser harsh environment. (2012) Optics Express, vol. 20 (n° 18). pp. 20028-20042. ISSN 1094-4087

Goiffon, Vincent and Cervantes, Paola and Virmontois, Cédric and Corbière, Franck and Magnan, Pierre and Estribeau, Magali Generic radiation hardened photodiode layouts for deep submicron CMOS image sensor processes. (2011) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC), 25 July 2011 - 29 July 2011 (Las Vegas, United States). (Unpublished)

Goiffon, Vincent and Virmontois, Cédric and Magnan, Pierre and Cervantes, Paola and Corbière, Franck and Estribeau, Magali and Pinel, Philippe Radiation damages in CMOS image sensors: testing and hardening challenges brought by deep sub-micrometer CIS processes. (2010) In: SPIE Remote Sensing, 20 - 23 Sept 2010, Toulouse, France .

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre Overview of ionizing radiation effects in image sensors fabricated in a deep-submicrometer CMOS imaging technology. (2009) IEEE Transactions on Electron Devices, vol. 5 (n° 11). pp. 2594 -2601. ISSN 0018-9383

Djité, Ibrahima and Magnan, Pierre and Estribeau, Magali and Petit, Sophie and Rolland, Guy and Saint-Pé, Olivier Theoretical evaluation of MTF and charge collection efficiency in CCD and CMOS image sensor. (2009) In: Optical Modeling and Performance Predictions IV : 5 - 6 August 2009, San Diego, California, United States. (Proceedings of the Spie ). Spie, Bellingham, United States. ISBN 978-0-8194-7717-0

Virmontois, Cédric and Djité, Ibrahima and Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre Proton and g-ray irradiation on deep sub-micron processed CMOS image sensor. (2009) In: International symposium on reliability of optoelectronics for space (ISROS 2009), 11-15 May 2009, Cagliari, Italy .

Goiffon, Vincent and Estribeau, Magali and Magnan, Pierre Optoelectrical performance evolution of CMOS image sensors exposed to gamma radiation. (2009) In: International Image Sensor Workshop, 25-28 June 2009, Bergen, Norway .

Martin-Gonthier, Philippe and Magnan, Pierre and Corbière, Franck and Estribeau, Magali and Huger, Nicolas and Boucher, Luc Dynamic range optimisation of CMOS image sensors dedicated to space applications. (2007) In: Remote Sensing : Sensors, Systems, and Next-Generation Satellites XI, 17 Sep 2007, Florence, Italy .

Martin-Gonthier, Philippe and Corbière, Franck and Huger, Nicolas and Estribeau, Magali and Engel, Celine and Magnan, Pierre and Saint-Pé, Olivier Evaluation of radiation hardness design techniques to improve radiation tolerance for CMOS image sensors dedicated to space applications. (2006) In: AMICSA 2006 : The first International Workshop on Analog and Mixed-Signal Integrated Circuits for Space , 02-3 0Oct 2006, Xanthi, Greece .

Estribeau, Magali and Magnan, Pierre CMOS pixels crosstalk mapping and its influence on measurements accuracy for space applications. (2005) In: SPIE Remote Sensing 2005, 19 Sept 2005, Brugge, Belgium .

Saint-Pé, Olivier and Tulet, Michel and Davancens, Robert and Larnaudie, Franck and Magnan, Pierre and Martin-Gonthier, Philippe and Corbière, Franck and Estribeau, Magali Space optical instruments optimisation thanks to CMOS image sensor technology. (2005) In: SPIE Remote Sensing 2005, 20 Sept 2005, Bruges, Belgium .

Estribeau, Magali and Magnan, Pierre Pixel Crosstalk and Correlation with Modulation Transfer Function of CMOS Image Sensor. (2005) In: SPIE Electronic Imaging 2005, 18 Jan 2005, San Jose, United States .

Estribeau, Magali and Magnan, Pierre CMOS pixels crosstalk mapping and Modulation Transfer Function. (2005) In: IEEE CCD&AIS Workshop 2005, 09-11 June 2005, Nagano Prefecture, Japan .

Estribeau, Magali and Magnan, Pierre Fast MTF measurement of CMOS imagers at the chip level using ISO 12233 slanted-edge methodology. (2004) In: SPIE Remote Sensing 2004, 13 Sep 2004, Maspalomas, Gran Canarias, Spain .

Saint-Pé, Olivier and Tulet, Michel and Davancens, Robert and Larnaudie, Franck and Magnan, Pierre and Martin-Gonthier, Philippe and Corbière, Franck and Belliot, Pierre and Estribeau, Magali Research-grade CMOS image sensors for remote sensing applications. (2004) In: SPIE Remote sensing 2004, 13 Sept 2004, Maspalomas, Gran Canarias, Spain .

Estribeau, Magali and Magnan, Pierre Fast MTF measurement of CMOS imagers using ISO 12233 slanted-edge methodology. (2004) In: SPIE Optical System Design 2003, 30 Sept 2003, Saint-Etienne, France .

This list was generated on Sat Sep 20 14:22:10 2014 CEST.