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Items where Person is "Alegria, A."
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ArticleRiedel, C. and Arinero, Richard and Tordjeman, Philippe and Lévêque, G. and Schwartz, G. A. and Alegria, A. and Colmenero, J. Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy. (2010) Physical Review E, vol. 81 (n° 1). ISSN 1539-3755 Book SectionArinero, R. and Riedel, C. and Schwartz, G.A. and Lévêque, G. and Alegria, A. and Tordjeman, Ph. and Israeloff, N.E. and Ramonda, M. and Colmenero, J. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2 |
