Items where Institution is :Other partners > University of Rochester (USA)

Goiffon, Vincent and Girard, Sylvain and Magnan, Pierre and Chabane, A. and Paillet, Philippe and Cervantes, Paola and Martin-Gonthier, Philippe and Baggio, Jacques and Estribeau, Magali and Bourgade, J.-L. and Darbon, S. and Rousseau, A. and Glebov, V. Yu. and Pien, G. and Sangster, T. C. Vulnerability of CMOS image sensors in megajoule class laser harsh environment. (2012) Optics Express, vol. 20 (n° 18). pp. 20028-20042. ISSN 1094-4087