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Riedel, Clément and Sweeney, R. and Israeloff, N. E. and Arinero, Richard and Schwartz, Gustavo Ariel and Alegría, Angel and Tordjeman, Philippe and Colmenero, Juan Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy. (2010) Applied Physics Letters, vol. 96 (n° 21). ISSN 0003-6951

Arinero, R. and Riedel, C. and Schwartz, G.A. and Lévêque, G. and Alegria, A. and Tordjeman, Ph. and Israeloff, N.E. and Ramonda, M. and Colmenero, J. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2

This list was generated on Wed Sep 17 12:51:55 2014 CEST.