Number of items at this level: 1.
Arinero, R. and Riedel, C. and Schwartz, G.A. and Lévêque, G. and Alegria, A. and Tordjeman, Ph. and Israeloff, N.E. and Ramonda, M. and Colmenero, J. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2
This list was generated on Tue May 21 02:03:46 2013 CEST.
