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Schwartz, Gustavo Ariel and Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Alegría, Angel and Colmenero, Juan Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM). (2011) Ultramicroscopy, vol. 111 (n° 8). pp. 1366-1369. ISSN 0304-3991

Riedel, C. and Schwartz, Gustavo Ariel and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Alegría, Angel and Colmenero, Juan Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images. (2010) Ultramicroscopy, vol. 110 (n° 6). pp. 634-638. ISSN 0304-3991

Riedel, C. and Arinero, R. and Tordjeman, Ph. and Ramonda, Michel and Lévêque, G. and Schwartz, G. A. and de Oteyza, D. G. and Alegría, A. and Colmenero, J. Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. (2010) The European Physical Journal Applied Physics, vol. 50 (n° 1). pp. 10501 1-10501 8. ISSN 1286-0042

Riedel, C. and Arinero, Richard and Tordjeman, Philippe and Lévêque, G. and Schwartz, G. A. and Alegria, A. and Colmenero, J. Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy. (2010) Physical Review E, vol. 81 (n° 1). ISSN 1539-3755

Arinero, R. and Riedel, C. and Schwartz, G.A. and Lévêque, G. and Alegria, A. and Tordjeman, Ph. and Israeloff, N.E. and Ramonda, M. and Colmenero, J. Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2

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