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Schwartz, Gustavo Ariel and Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Alegría, Angel and Colmenero, Juan Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM). (2011) Ultramicroscopy, vol. 111 (n° 8). pp. 1366-1369. ISSN 0304-3991

Riedel, Clément and Schwartz, Gustavo Ariel and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Alegría, Angel and Colmenero, Juan Nanoscale dielectric properties of insulating thin films: From single point measurements to quantitative images. (2010) Ultramicroscopy, vol. 110 (n° 6). pp. 634-638. ISSN 0304-3991

Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Ramonda, Michel and Lévêque, Gérard and Schwartz, Gustavo Ariel and De Oteyza, Dimas G. and Alegría, Angel and Colmenero, Juan Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy. (2010) The European Physical Journal Applied Physics, vol. 50 (n° 1). pp. 10501 1-10501 8. ISSN 1286-0042

Riedel, Clément and Arinero, Richard and Tordjeman, Philippe and Lévêque, Gérard and Schwartz, Gustavo Ariel and Alegría, Angel and Colmenero, Juan Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy. (2010) Physical Review E, vol. 81 (n° 1). ISSN 1539-3755

Arinero, Richard and Riedel, Clément and Schwartz, Gustavo Ariel and Lévêque, Gérard and Alegría, Angel and Tordjeman, Philippe and Israeloff, N. E. and Ramonda, Michel and Colmenero, Juan Measuring dielectric properties at the nanoscale using Electrostatic Force Microscopy. (2010) In: Microscopy: Science, Technology, Applications and Education. (FORMATEX Microscopy Book Series ; n° 4). Formatex Research Center, Spain, pp. 1963-1977. ISBN 978-84-614-6191-2

This list was generated on Sat Dec 20 15:56:30 2014 CET.